XAFS at the Canadian light source

D. T. Jiang, N. Chen, L. Zhang, K. Malgorzata, G. Wright, R. Igarashi, D. Beauregard, M. Kirkham, M. McKibben

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

Canadian Light Source Hard X-ray Micro-Analysis Beamline (HXMA, 06ID-1) is a hard X-ray spectroscopy beamline currently under commissioning. The source of the beamline is a superconducting wiggler covering 5 to 40 keV. The primary optics include a cryogenically cooled double crystal monochromator (Si 111 and 220), white beam vertical collimating and toroidal focusing mirrors. End station experimental capabilities include XAFS (Ge solid state detectors), microprobe (Kirkpatrick-Baez murors, Ge solid state detector and image plate area detector), and diffraction (Huber psi-8 and powder diffraction setups, with diamond anvil cell high pressure sample environment). Commissioning status for the XAFS capabilities is described.

Original languageEnglish (US)
Title of host publicationX-RAY ABSORPTION FINE STRUCTURE - XAFS13
Subtitle of host publication13th International Conference
Pages893-895
Number of pages3
DOIs
StatePublished - Mar 26 2007
EventX-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference - Stanford, CA, United States
Duration: Jul 9 2006Jul 14 2006

Publication series

NameAIP Conference Proceedings
Volume882
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

OtherX-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference
CountryUnited States
CityStanford, CA
Period7/9/067/14/06

Fingerprint

light sources
detectors
solid state
hubs
anvils
monochromators
microanalysis
diffraction
coverings
x rays
stations
diamonds
optics
mirrors
cells
spectroscopy
crystals

Keywords

  • Beamline
  • Diffraction
  • Microprobe
  • Synchrotron
  • XAFS

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Jiang, D. T., Chen, N., Zhang, L., Malgorzata, K., Wright, G., Igarashi, R., ... McKibben, M. (2007). XAFS at the Canadian light source. In X-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference (pp. 893-895). (AIP Conference Proceedings; Vol. 882). https://doi.org/10.1063/1.2644695

XAFS at the Canadian light source. / Jiang, D. T.; Chen, N.; Zhang, L.; Malgorzata, K.; Wright, G.; Igarashi, R.; Beauregard, D.; Kirkham, M.; McKibben, M.

X-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference. 2007. p. 893-895 (AIP Conference Proceedings; Vol. 882).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Jiang, DT, Chen, N, Zhang, L, Malgorzata, K, Wright, G, Igarashi, R, Beauregard, D, Kirkham, M & McKibben, M 2007, XAFS at the Canadian light source. in X-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference. AIP Conference Proceedings, vol. 882, pp. 893-895, X-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference, Stanford, CA, United States, 7/9/06. https://doi.org/10.1063/1.2644695
Jiang DT, Chen N, Zhang L, Malgorzata K, Wright G, Igarashi R et al. XAFS at the Canadian light source. In X-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference. 2007. p. 893-895. (AIP Conference Proceedings). https://doi.org/10.1063/1.2644695
Jiang, D. T. ; Chen, N. ; Zhang, L. ; Malgorzata, K. ; Wright, G. ; Igarashi, R. ; Beauregard, D. ; Kirkham, M. ; McKibben, M. / XAFS at the Canadian light source. X-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference. 2007. pp. 893-895 (AIP Conference Proceedings).
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