Visible and infrared optical constants of electrochromic materials for emissivity modulation applications

Jeffrey S. Hale, Michael DeVries, Brad Dworak, John A. Woollam

Research output: Contribution to journalArticle

72 Citations (Scopus)

Abstract

Electrochromic materials are being studied for applications involving infrared emissivity modulation. The materials being investigated are amorphous WO3 and poly-crystalline WO3, NiO, and Ta2O5. Hydrogen ions are intercalated into and deintercalated from the films leading to changes in the optical properties of the materials. Visible and infrared ellipsometry are used to measure the optical constants of these materials in various states of ion intercalation and to determine the reversibility of the reactions. The spectral range for the optical constants determination is from 0.3 to 14 μm. Simulations of electrochromic device structures using these optical constants show an emissivity modulation greater than 50% for wave-lengths near the peak of the room temperature blackbody curve.

Original languageEnglish (US)
Pages (from-to)205-209
Number of pages5
JournalThin Solid Films
Volume313-314
DOIs
StatePublished - Feb 13 1998

Fingerprint

Optical constants
emissivity
Modulation
Infrared radiation
modulation
hydrogen ions
Electrochromic devices
intercalation
ellipsometry
Ellipsometry
Ions
Intercalation
Protons
optical properties
Optical properties
room temperature
curves
Crystalline materials
Wavelength
Hydrogen

Keywords

  • Electrochromism
  • Ellipsometry
  • Nickel oxide
  • Tungsten oxide

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

Visible and infrared optical constants of electrochromic materials for emissivity modulation applications. / Hale, Jeffrey S.; DeVries, Michael; Dworak, Brad; Woollam, John A.

In: Thin Solid Films, Vol. 313-314, 13.02.1998, p. 205-209.

Research output: Contribution to journalArticle

Hale, Jeffrey S. ; DeVries, Michael ; Dworak, Brad ; Woollam, John A. / Visible and infrared optical constants of electrochromic materials for emissivity modulation applications. In: Thin Solid Films. 1998 ; Vol. 313-314. pp. 205-209.
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