Virtual separation approach to study porous ultra-thin films by combined spectroscopic ellipsometry and quartz crystal microbalance methods

K. B. Rodenhausen, Mathias Schubert

Research output: Contribution to journalArticle

20 Citations (Scopus)

Abstract

Spectroscopic ellipsometry (SE) and quartz crystal microbalance with dissipation (QCM-D) techniques have been extensively used as independent surface characterization tools to monitor in-situ thin film formation. They provide different information for ultra-thin films because QCM-D is sensitive to the solvent content while SE is not. For using these two techniques in tandem, we present a virtual separation approach to enable the determination of both ultra-thin film thickness and porosity. Assumptions for the intrinsic molecular polarizability (index of refraction no) and density (ρo) of the organic adsorbent must be made, and the consequences for these parameters' values are discussed.

Original languageEnglish (US)
Pages (from-to)2772-2776
Number of pages5
JournalThin Solid Films
Volume519
Issue number9
DOIs
StatePublished - Feb 28 2011

Fingerprint

Spectroscopic ellipsometry
Ultrathin films
Quartz crystal microbalances
quartz crystals
microbalances
ellipsometry
dissipation
thin films
Refraction
Adsorbents
crystals
Film thickness
Porosity
adsorbents
Thin films
refraction
film thickness
porosity

Keywords

  • Organic thin films
  • Quartz crystal microbalance
  • Spectroscopic ellipsometry

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

Virtual separation approach to study porous ultra-thin films by combined spectroscopic ellipsometry and quartz crystal microbalance methods. / Rodenhausen, K. B.; Schubert, Mathias.

In: Thin Solid Films, Vol. 519, No. 9, 28.02.2011, p. 2772-2776.

Research output: Contribution to journalArticle

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