Video rate atomic force microscopy

Use of compressive scanning for nanoscale video imaging

Ning Xi, Bo Song, Ruiguo Yang, King Lai, Hongzhi Chen, Chengeng Qu, Liangliang Chen

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

Atomic Force Microscopy (AFM) is a powerful instrument for studying and exploring the nanoworld [1]. AFM can obtain ultrahigh-resolution images at the subnanoscale level. However, AFM has a very significant drawback of slow imaging speed, which is due to its working principle. A conventional AFM conducts a raster scan of an entire area to generate a topography image. Therefore, the frame rate is low, making it impossible for observation of biological and physical processes that are dynamic in nature with a lifespan of a few minutes or even seconds, such as the structural change of cells, carbon nanotube shape change, and so forth [2]?[5]. In addition, for AFM-based nanomanipulations and nanomeasurement, the low frame rate makes it difficult to achieve a real-time visual guide manipulation [6], [7]. Operators usually have to wait for finishing imaging to visualize the manipulating results. Therefore, there is an increasing demand on a fast-imaging AFM system that can capture a continuous phenomenon occurring in seconds.

Original languageEnglish (US)
Article number6450167
Pages (from-to)4-8
Number of pages5
JournalIEEE Nanotechnology Magazine
Volume7
Issue number1
DOIs
StatePublished - Apr 8 2013

Fingerprint

Atomic force microscopy
Scanning
Imaging techniques
Image resolution
Topography
Carbon nanotubes

ASJC Scopus subject areas

  • Mechanical Engineering
  • Electrical and Electronic Engineering

Cite this

Video rate atomic force microscopy : Use of compressive scanning for nanoscale video imaging. / Xi, Ning; Song, Bo; Yang, Ruiguo; Lai, King; Chen, Hongzhi; Qu, Chengeng; Chen, Liangliang.

In: IEEE Nanotechnology Magazine, Vol. 7, No. 1, 6450167, 08.04.2013, p. 4-8.

Research output: Contribution to journalArticle

Xi, Ning ; Song, Bo ; Yang, Ruiguo ; Lai, King ; Chen, Hongzhi ; Qu, Chengeng ; Chen, Liangliang. / Video rate atomic force microscopy : Use of compressive scanning for nanoscale video imaging. In: IEEE Nanotechnology Magazine. 2013 ; Vol. 7, No. 1. pp. 4-8.
@article{c70320c4de1a4baebc5d51189f8a99bb,
title = "Video rate atomic force microscopy: Use of compressive scanning for nanoscale video imaging",
abstract = "Atomic Force Microscopy (AFM) is a powerful instrument for studying and exploring the nanoworld [1]. AFM can obtain ultrahigh-resolution images at the subnanoscale level. However, AFM has a very significant drawback of slow imaging speed, which is due to its working principle. A conventional AFM conducts a raster scan of an entire area to generate a topography image. Therefore, the frame rate is low, making it impossible for observation of biological and physical processes that are dynamic in nature with a lifespan of a few minutes or even seconds, such as the structural change of cells, carbon nanotube shape change, and so forth [2]?[5]. In addition, for AFM-based nanomanipulations and nanomeasurement, the low frame rate makes it difficult to achieve a real-time visual guide manipulation [6], [7]. Operators usually have to wait for finishing imaging to visualize the manipulating results. Therefore, there is an increasing demand on a fast-imaging AFM system that can capture a continuous phenomenon occurring in seconds.",
author = "Ning Xi and Bo Song and Ruiguo Yang and King Lai and Hongzhi Chen and Chengeng Qu and Liangliang Chen",
year = "2013",
month = "4",
day = "8",
doi = "10.1109/MNANO.2013.2237711",
language = "English (US)",
volume = "7",
pages = "4--8",
journal = "IEEE Nanotechnology Magazine",
issn = "1932-4510",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "1",

}

TY - JOUR

T1 - Video rate atomic force microscopy

T2 - Use of compressive scanning for nanoscale video imaging

AU - Xi, Ning

AU - Song, Bo

AU - Yang, Ruiguo

AU - Lai, King

AU - Chen, Hongzhi

AU - Qu, Chengeng

AU - Chen, Liangliang

PY - 2013/4/8

Y1 - 2013/4/8

N2 - Atomic Force Microscopy (AFM) is a powerful instrument for studying and exploring the nanoworld [1]. AFM can obtain ultrahigh-resolution images at the subnanoscale level. However, AFM has a very significant drawback of slow imaging speed, which is due to its working principle. A conventional AFM conducts a raster scan of an entire area to generate a topography image. Therefore, the frame rate is low, making it impossible for observation of biological and physical processes that are dynamic in nature with a lifespan of a few minutes or even seconds, such as the structural change of cells, carbon nanotube shape change, and so forth [2]?[5]. In addition, for AFM-based nanomanipulations and nanomeasurement, the low frame rate makes it difficult to achieve a real-time visual guide manipulation [6], [7]. Operators usually have to wait for finishing imaging to visualize the manipulating results. Therefore, there is an increasing demand on a fast-imaging AFM system that can capture a continuous phenomenon occurring in seconds.

AB - Atomic Force Microscopy (AFM) is a powerful instrument for studying and exploring the nanoworld [1]. AFM can obtain ultrahigh-resolution images at the subnanoscale level. However, AFM has a very significant drawback of slow imaging speed, which is due to its working principle. A conventional AFM conducts a raster scan of an entire area to generate a topography image. Therefore, the frame rate is low, making it impossible for observation of biological and physical processes that are dynamic in nature with a lifespan of a few minutes or even seconds, such as the structural change of cells, carbon nanotube shape change, and so forth [2]?[5]. In addition, for AFM-based nanomanipulations and nanomeasurement, the low frame rate makes it difficult to achieve a real-time visual guide manipulation [6], [7]. Operators usually have to wait for finishing imaging to visualize the manipulating results. Therefore, there is an increasing demand on a fast-imaging AFM system that can capture a continuous phenomenon occurring in seconds.

UR - http://www.scopus.com/inward/record.url?scp=84875725441&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84875725441&partnerID=8YFLogxK

U2 - 10.1109/MNANO.2013.2237711

DO - 10.1109/MNANO.2013.2237711

M3 - Article

VL - 7

SP - 4

EP - 8

JO - IEEE Nanotechnology Magazine

JF - IEEE Nanotechnology Magazine

SN - 1932-4510

IS - 1

M1 - 6450167

ER -