Vector magneto-optical generalized ellipsometry for sculptured thin films

Daniel Schmidt, Chad Briley, Eva Schubert, Mathias Schubert

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Vector magneto-optical generalized ellipsometry is employed for the determination of the three-dimensional magnetization properties of magnetized thin solid as well as slanted columnar thin film samples. The permalloy thin films were probed by means of Mueller matrix ellipsometry at room-temperature while an external magnetic field was rotated step-wise within each plane of a three-dimensional Cartesian coordinate system (spatial hysteresis loops). Model analysis of the magneto-optical coupling parameter (proportional to the magnetization) confirms the expected uniaxial magnetization shape of the thin solid film and reveals the three-dimensional magneto-optic anisotropy of the nanostructured thin film.

Original languageEnglish (US)
Article number123109
JournalApplied Physics Letters
Volume102
Issue number12
DOIs
StatePublished - Mar 25 2013

Fingerprint

ellipsometry
magnetization
thin films
optical coupling
Cartesian coordinates
magneto-optics
Permalloys (trademark)
hysteresis
anisotropy
room temperature
matrices
magnetic fields

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Vector magneto-optical generalized ellipsometry for sculptured thin films. / Schmidt, Daniel; Briley, Chad; Schubert, Eva; Schubert, Mathias.

In: Applied Physics Letters, Vol. 102, No. 12, 123109, 25.03.2013.

Research output: Contribution to journalArticle

Schmidt, Daniel ; Briley, Chad ; Schubert, Eva ; Schubert, Mathias. / Vector magneto-optical generalized ellipsometry for sculptured thin films. In: Applied Physics Letters. 2013 ; Vol. 102, No. 12.
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