Ultrasonic flaw detection for two-phase Ti-6Al-4V based on secondary scattering

Yingdong Fu, Ping Hu, Joseph A. Turner, Yongfeng Song, Xiongbing Li

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Ultrasonic inspection of two-phase Ti-6Al-4V materials is enhanced using a more complex microstructure model within the doubly-scattered response (DSR) limit. The new model is used to calculate the corresponding bounds of grain noise and these bounds are then used to define a time-dependent threshold for ultrasonic testing. A Ti-6Al-4V specimen with flat bottom holes is manufactured for ultrasonic measurements to verify the measurement sensitivity to sub-wavelength flaws. The experimental results show that the present method has obvious advantages over traditional methods associated with a fixed threshold as well as the time-dependent threshold based on the singly-scattered response (SSR). This work provides an effective tool for distinguishing sub-wavelength flaws from grain noise, thereby limiting both false positives and missed detections.

Original languageEnglish (US)
Pages (from-to)199-206
Number of pages8
JournalNDT and E International
Volume102
DOIs
StatePublished - Mar 2019

Fingerprint

ultrasonic flaw detection
ultrasonics
Ultrasonics
Scattering
Ultrasonic measurement
Wavelength
Ultrasonic testing
Defects
thresholds
scattering
Inspection
defects
wavelengths
Microstructure
inspection
microstructure

Keywords

  • Double scattering
  • Hexagonal grains
  • Sub-wavelength flaws
  • Two-phase Ti-6Al-4V materials
  • Ultrasonic testing

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering

Cite this

Ultrasonic flaw detection for two-phase Ti-6Al-4V based on secondary scattering. / Fu, Yingdong; Hu, Ping; Turner, Joseph A.; Song, Yongfeng; Li, Xiongbing.

In: NDT and E International, Vol. 102, 03.2019, p. 199-206.

Research output: Contribution to journalArticle

Fu, Yingdong ; Hu, Ping ; Turner, Joseph A. ; Song, Yongfeng ; Li, Xiongbing. / Ultrasonic flaw detection for two-phase Ti-6Al-4V based on secondary scattering. In: NDT and E International. 2019 ; Vol. 102. pp. 199-206.
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