Ultrasmall-angle X-ray scattering analysis of photonic crystal structure

V. V. Abramova, A. S. Sinitskii, N. A. Grigor'Eva, S. V. Grigor'Ev, D. V. Belov, A. V. Petukhov, A. A. Mistonov, A. V. Vasil'Eva, Yu D. Tret'Yakov

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Abstract

The results of an ultrasmall-angle X-ray scattering study of iron(III) oxide inverse opal thin films are presented. The photonic crystals examined are shown to have fcc structure with amount of stacking faults varying among the samples. The method used in this study makes it possible to easily distinguish between samples with predominantly twinned fcc structure and nearly perfect fcc stacking. The difference observed between samples fabricated under identical conditions is attributed to random layer stacking in the self-assembled colloidal crystals used as templates for fabricating the inverse opals. The present method provides a versatile tool for analyzing photonic crystal structure in studies of inverse opals made of various materials, colloidal crystals, and three-dimensional photonic crystals of other types.

Original languageEnglish (US)
Pages (from-to)29-34
Number of pages6
JournalJournal of Experimental and Theoretical Physics
Volume109
Issue number1
DOIs
Publication statusPublished - Jul 1 2009

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Abramova, V. V., Sinitskii, A. S., Grigor'Eva, N. A., Grigor'Ev, S. V., Belov, D. V., Petukhov, A. V., ... Tret'Yakov, Y. D. (2009). Ultrasmall-angle X-ray scattering analysis of photonic crystal structure. Journal of Experimental and Theoretical Physics, 109(1), 29-34. https://doi.org/10.1134/S1063776109070048