Thickness dependence of interfacial magneto-optic effects in Pt/Co multilayers

Xiang Gao, Michael J. DeVries, Daniel W. Thompson, John A. Woollam

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Spectroscopic ellipsometry and magneto-optic Kerr effects are measured on Pt/Co multilayers with a series of Co layer thicknesses from 0.08 to 1 nm. An electromagnetic theory of multilayered structures allows regression analysis fits between acquired data and parameter dependent model analysis. Recently, we determined the single layer Co magneto-optic Voigt parameter and found that it depends on Co layer thickness. In the present work, we report an in-depth study of interfacial magneto-optic effects for a large number of Pt/Co multilayer samples. Kerr rotation and ellipticity were measured over the spectral range from 200 to 1700 nm. Voigt parameters of the magnetic layers for these Pt/Co multilayer samples with different thicknesses were compared, and the Pt-Co interface thicknesses were determined in terms of the material dielectric tensor.

Original languageEnglish (US)
Pages (from-to)6747-6749
Number of pages3
JournalJournal of Applied Physics
Volume83
Issue number11
DOIs
StatePublished - Jan 1 1998

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magneto-optics
ellipticity
Kerr effects
ellipsometry
regression analysis
tensors
electromagnetism

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Thickness dependence of interfacial magneto-optic effects in Pt/Co multilayers. / Gao, Xiang; DeVries, Michael J.; Thompson, Daniel W.; Woollam, John A.

In: Journal of Applied Physics, Vol. 83, No. 11, 01.01.1998, p. 6747-6749.

Research output: Contribution to journalArticle

Gao, Xiang ; DeVries, Michael J. ; Thompson, Daniel W. ; Woollam, John A. / Thickness dependence of interfacial magneto-optic effects in Pt/Co multilayers. In: Journal of Applied Physics. 1998 ; Vol. 83, No. 11. pp. 6747-6749.
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