The structure and magneto-optic properties of MnAl-based thin films

J. X. Shen, Roger D. Kirby, D. J. Sellmyer

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

We have measured the magnetization and magneto-optic Kerr rotation of sputtered thin films of Mn-Al-Cu ternary alloys over a wide composition range and for substrate temperatures between 25 and 450°C. Magnetization and x-ray diffraction measurements suggest that our films are a mixture of the ferromagnetic kappa (κ) phase of MnAl and a highly paramagnetic amorphous phase. Room-temperature magneto-optic measurements on these films show a saturation polar Kerr rotation of up to 0.12°with little wavelength dependence.

Original languageEnglish (US)
Pages (from-to)4929-4931
Number of pages3
JournalJournal of Applied Physics
Volume67
Issue number9
DOIs
StatePublished - Dec 1 1990

Fingerprint

magneto-optics
magnetization
ternary alloys
thin films
x ray diffraction
saturation
room temperature
wavelengths
temperature

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

The structure and magneto-optic properties of MnAl-based thin films. / Shen, J. X.; Kirby, Roger D.; Sellmyer, D. J.

In: Journal of Applied Physics, Vol. 67, No. 9, 01.12.1990, p. 4929-4931.

Research output: Contribution to journalArticle

Shen, J. X. ; Kirby, Roger D. ; Sellmyer, D. J. / The structure and magneto-optic properties of MnAl-based thin films. In: Journal of Applied Physics. 1990 ; Vol. 67, No. 9. pp. 4929-4931.
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