The structural and magnetic properties of films of Pr2Fe14B and Nd2Fe14B cosputtered with Ta

K. D. Aylesworth, D. J. Sellmyer, G. C. Hadjipanayis

Research output: Contribution to journalArticle

24 Citations (Scopus)

Abstract

The results of structural and magnetic measurements on films, produced by serially depositing R2Fe14B (R = Nd, Pr) and Ta, are reported. The materials were deposited 10-200 Å at a time onto 500-700°C Ta substrates. The structures of the resulting films were examined by large- and small-angle X-ray diffraction. The magnetic properties were studied at room temperature in a Vibrating Sample Magnetometer (VSM) with a maximum field of 17.1 kOe, and at cryogenic temperatures in a VSM with a maximum field of 80 kOe. The structural and magnetic properties depend upon the nominal thickness of the Ta, even though interlayer diffusion appears to be significant for Ta thickness less than about 30 Å. The trends in the coercivities can be qualitatively explained by assuming a nucleation mechanism for magnetization reversal and correlating the coercivity with the degree of c-axis alignment in the 2:14:1 phase.

Original languageEnglish (US)
Pages (from-to)65-70
Number of pages6
JournalJournal of Magnetism and Magnetic Materials
Volume98
Issue number1-2
DOIs
StatePublished - Jul 1991

Fingerprint

Magnetometers
Coercive force
magnetometers
coercivity
Structural properties
Magnetic properties
magnetic properties
Magnetization reversal
Magnetic variables measurement
cryogenic temperature
Cryogenics
magnetic measurement
interlayers
Nucleation
alignment
nucleation
trends
X ray diffraction
Temperature
magnetization

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

The structural and magnetic properties of films of Pr2Fe14B and Nd2Fe14B cosputtered with Ta. / Aylesworth, K. D.; Sellmyer, D. J.; Hadjipanayis, G. C.

In: Journal of Magnetism and Magnetic Materials, Vol. 98, No. 1-2, 07.1991, p. 65-70.

Research output: Contribution to journalArticle

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AB - The results of structural and magnetic measurements on films, produced by serially depositing R2Fe14B (R = Nd, Pr) and Ta, are reported. The materials were deposited 10-200 Å at a time onto 500-700°C Ta substrates. The structures of the resulting films were examined by large- and small-angle X-ray diffraction. The magnetic properties were studied at room temperature in a Vibrating Sample Magnetometer (VSM) with a maximum field of 17.1 kOe, and at cryogenic temperatures in a VSM with a maximum field of 80 kOe. The structural and magnetic properties depend upon the nominal thickness of the Ta, even though interlayer diffusion appears to be significant for Ta thickness less than about 30 Å. The trends in the coercivities can be qualitatively explained by assuming a nucleation mechanism for magnetization reversal and correlating the coercivity with the degree of c-axis alignment in the 2:14:1 phase.

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