The optical hall effect

T. Hofmann, C. M. Herzinger, C. Krahmer, K. Streubel, M. Schubert

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

Classic electrical Hall effect measurements are standard for electrical characterization of free charge carriers in semiconductor layer structures. We demonstrate that magnetooptic generalized ellipsometry at long wavelengths when applied to conducting or semiconducting multilayer or nanoscopically in-homogeneous structures can yield equivalent and even much increased information. We term this new method optical Hall effect, because it finds simple explanation within the model described by E.H. Hall for the occurrence of the transverse and longitudinal voltages augmented by non-locality of the charge response in time. Transverse and longitudinal birefringence cause magnificent anisotropic polarization responses unraveling rich information on free charge properties of complex-structured samples due to external magnetic fields and collective movement of bound and unbound charge carriers. We demonstrate that with our technique density, type, mobility, effective mass including anisotropy can be measured without any electrical contact in buried structures, and which may have been inaccessible to any true electrical evaluation thus far. We predict a realm of applications for the optical Hall effect in future materials research and engineering. Generalized ellipsometry measures the magnetic field dependent dielectric tensor in multilayered, conductive semiconductor heterostructures and determines the free charge carrier properties of the individual sample constituents.

Original languageEnglish (US)
Pages (from-to)779-783
Number of pages5
JournalPhysica Status Solidi (A) Applications and Materials Science
Volume205
Issue number4
DOIs
StatePublished - Apr 1 2008

Fingerprint

Hall effect
Charge carriers
charge carriers
Ellipsometry
ellipsometry
Semiconductor materials
Magnetic fields
Magnetooptical effects
Birefringence
magnetic fields
Tensors
birefringence
Heterojunctions
electric contacts
Multilayers
Anisotropy
engineering
occurrences
tensors
optics

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering
  • Materials Chemistry

Cite this

The optical hall effect. / Hofmann, T.; Herzinger, C. M.; Krahmer, C.; Streubel, K.; Schubert, M.

In: Physica Status Solidi (A) Applications and Materials Science, Vol. 205, No. 4, 01.04.2008, p. 779-783.

Research output: Contribution to journalArticle

Hofmann, T, Herzinger, CM, Krahmer, C, Streubel, K & Schubert, M 2008, 'The optical hall effect', Physica Status Solidi (A) Applications and Materials Science, vol. 205, no. 4, pp. 779-783. https://doi.org/10.1002/pssa.200777904
Hofmann, T. ; Herzinger, C. M. ; Krahmer, C. ; Streubel, K. ; Schubert, M. / The optical hall effect. In: Physica Status Solidi (A) Applications and Materials Science. 2008 ; Vol. 205, No. 4. pp. 779-783.
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