Terahertz generalized Mueller-matrix ellipsometry

T. Hofmann, U. Schade, C. M. Herzinger, P. Esquinazi, Mathias Schubert

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

We report on the first successful generalized Mueller-matrix ellipsometry measurements in the THz-frequency domain using the high-brilliance THz synchrotron radiation source IRIS at the electron storage ring BESSY, Germany. Generalized Ellipsometry, which is known as a powerful tool for measurement of optical constants including anisotropy and which was previously used in the FIR to VUV spectral range, is now employed for the first time to investigate condensed matter samples in the frequency range from 0.9 to 8 THz (30 to 650 cm -1). Exemplarily, results obtained from bound and unbound charge-carrier investigations in low-dimensional semi- and superconducting systems are presented. Future applications of this technique for investigation of charge-carrier dynamics in magnetic fields are envisioned.

Original languageEnglish (US)
Title of host publicationTerahertz and Gigahertz Electronics and Photonics V
DOIs
StatePublished - May 29 2006
EventTerahertz and Gigahertz Electronics and Photonics V - San Jose, CA, United States
Duration: Jan 25 2006Jan 26 2006

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6120
ISSN (Print)0277-786X

Other

OtherTerahertz and Gigahertz Electronics and Photonics V
CountryUnited States
CitySan Jose, CA
Period1/25/061/26/06

Fingerprint

Mueller Matrix
Ellipsometry
Charge carriers
ellipsometry
charge carriers
Optical constants
Storage rings
matrices
Synchrotron radiation
radiation sources
Germany
Charge
Optical Constants
Synchrotron Radiation
synchrotron radiation
Anisotropy
frequency ranges
Magnetic fields
Range of data
anisotropy

Keywords

  • Far infrared
  • Free-charge-carrier response
  • Generalized Mueller-matrix ellipsometry
  • Magnetooptic anisotropy
  • THz

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Hofmann, T., Schade, U., Herzinger, C. M., Esquinazi, P., & Schubert, M. (2006). Terahertz generalized Mueller-matrix ellipsometry. In Terahertz and Gigahertz Electronics and Photonics V [61200D] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6120). https://doi.org/10.1117/12.660382

Terahertz generalized Mueller-matrix ellipsometry. / Hofmann, T.; Schade, U.; Herzinger, C. M.; Esquinazi, P.; Schubert, Mathias.

Terahertz and Gigahertz Electronics and Photonics V. 2006. 61200D (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6120).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hofmann, T, Schade, U, Herzinger, CM, Esquinazi, P & Schubert, M 2006, Terahertz generalized Mueller-matrix ellipsometry. in Terahertz and Gigahertz Electronics and Photonics V., 61200D, Proceedings of SPIE - The International Society for Optical Engineering, vol. 6120, Terahertz and Gigahertz Electronics and Photonics V, San Jose, CA, United States, 1/25/06. https://doi.org/10.1117/12.660382
Hofmann T, Schade U, Herzinger CM, Esquinazi P, Schubert M. Terahertz generalized Mueller-matrix ellipsometry. In Terahertz and Gigahertz Electronics and Photonics V. 2006. 61200D. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.660382
Hofmann, T. ; Schade, U. ; Herzinger, C. M. ; Esquinazi, P. ; Schubert, Mathias. / Terahertz generalized Mueller-matrix ellipsometry. Terahertz and Gigahertz Electronics and Photonics V. 2006. (Proceedings of SPIE - The International Society for Optical Engineering).
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