Temperature-dependent resistivity of highly disordered Ni-Cr-Al alloys

R. Hight, C. Plough, David J Sellmyer

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Measurements are reported on the electrical resistivity of highly disordered Ni-Cr-Al films between 4.2 and 300 K. X-ray diffraction measurements show the films to be crystalline with a bcc structure. Negative temperature coefficients are observed and the resistivity data above about 50 K can be fitted by the expression (T)=0[1-cln(T2+2)], where depends on the heat treatment of the sample.

Original languageEnglish (US)
Pages (from-to)5920-5921
Number of pages2
JournalPhysical Review B
Volume29
Issue number10
DOIs
StatePublished - Jan 1 1984

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Negative temperature coefficient
electrical resistivity
heat treatment
Heat treatment
Crystalline materials
X ray diffraction
Temperature
temperature
coefficients
diffraction
x rays

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Temperature-dependent resistivity of highly disordered Ni-Cr-Al alloys. / Hight, R.; Plough, C.; Sellmyer, David J.

In: Physical Review B, Vol. 29, No. 10, 01.01.1984, p. 5920-5921.

Research output: Contribution to journalArticle

Hight, R. ; Plough, C. ; Sellmyer, David J. / Temperature-dependent resistivity of highly disordered Ni-Cr-Al alloys. In: Physical Review B. 1984 ; Vol. 29, No. 10. pp. 5920-5921.
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