Temperature dependence of optical properties of GaAs

Huade Yao, Paul G. Snyder, John A. Woollam

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Abstract

Pseudodielectric functions 〈ε〉= 〈ε1〉+i〈ε2〉 of GaAs were measured by spectroscopic ellipsometry (SE), in the range of 1.6-4.45 eV, at temperatures from room temperature (RT) to ∼610 °C. A very clean, smooth surface was obtained by first growing an epitaxial layer of GaAs on a GaAs substrate and immediately capping it with a protective layer of arsenic. The cap prevented surface oxidation during transport to the measurement chamber, where it was evaporated under ultrahigh vacuum at ∼350 °C. Room-temperature SE results from this surface are in good agreement with those in the literature obtained by wet-chemical etching. A quantitative analysis of the 〈ε〉 spectrum was made using the harmonic-oscillator approximation (HOA). It is shown by the HOA that the E1 and E11 energy-band critical points shift downward ∼300 meV as temperature increases from RT to ∼610 °C. An algorithm was developed, using the measured optical constants at a number of fixed temperatures, to compute the dielectric function spectrum at an arbitrary temperature in the range of 22-610 °C. Therefore, the ellipsometer can be utilized as an optical thermometer to determine the sample surface temperature.

Original languageEnglish (US)
Pages (from-to)3261-3267
Number of pages7
JournalJournal of Applied Physics
Volume70
Issue number6
DOIs
Publication statusPublished - Dec 1 1991

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

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