TEM characterization of self-assembled magnetic nanowires

X. Zhao, Y. Liu, M. Zheng, Z. Hao, S. Bandyopadhay, D. Sellmyer

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)1368-1369
Number of pages2
JournalMicroscopy and Microanalysis
Volume8
Issue numberSUPPL. 2
Publication statusPublished - Nov 20 2002

ASJC Scopus subject areas

  • Instrumentation

Cite this

Zhao, X., Liu, Y., Zheng, M., Hao, Z., Bandyopadhay, S., & Sellmyer, D. (2002). TEM characterization of self-assembled magnetic nanowires. Microscopy and Microanalysis, 8(SUPPL. 2), 1368-1369.