TEM characterization of self-assembled magnetic nanowires

X. Zhao, Y. Liu, M. Zheng, Z. Hao, S. Bandyopadhay, David J Sellmyer

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)1368-1369
Number of pages2
JournalMicroscopy and Microanalysis
Volume8
Issue numberSUPPL. 2
StatePublished - Nov 20 2002

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Nanowires
nanowires
Transmission electron microscopy
transmission electron microscopy

ASJC Scopus subject areas

  • Instrumentation

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Zhao, X., Liu, Y., Zheng, M., Hao, Z., Bandyopadhay, S., & Sellmyer, D. J. (2002). TEM characterization of self-assembled magnetic nanowires. Microscopy and Microanalysis, 8(SUPPL. 2), 1368-1369.

TEM characterization of self-assembled magnetic nanowires. / Zhao, X.; Liu, Y.; Zheng, M.; Hao, Z.; Bandyopadhay, S.; Sellmyer, David J.

In: Microscopy and Microanalysis, Vol. 8, No. SUPPL. 2, 20.11.2002, p. 1368-1369.

Research output: Contribution to journalArticle

Zhao, X, Liu, Y, Zheng, M, Hao, Z, Bandyopadhay, S & Sellmyer, DJ 2002, 'TEM characterization of self-assembled magnetic nanowires', Microscopy and Microanalysis, vol. 8, no. SUPPL. 2, pp. 1368-1369.
Zhao X, Liu Y, Zheng M, Hao Z, Bandyopadhay S, Sellmyer DJ. TEM characterization of self-assembled magnetic nanowires. Microscopy and Microanalysis. 2002 Nov 20;8(SUPPL. 2):1368-1369.
Zhao, X. ; Liu, Y. ; Zheng, M. ; Hao, Z. ; Bandyopadhay, S. ; Sellmyer, David J. / TEM characterization of self-assembled magnetic nanowires. In: Microscopy and Microanalysis. 2002 ; Vol. 8, No. SUPPL. 2. pp. 1368-1369.
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