Techniques for consecutive TEM and Atom probe tomography analysis of nanowires

D. R. Diercks, B. P. Gorman, Chin Li "Barry" Cheung, G. Wang

Research output: Contribution to journalArticle

20 Citations (Scopus)
Original languageEnglish (US)
Pages (from-to)254-255
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 1 2009

Fingerprint

Nanowires
Tomography
nanowires
tomography
Transmission electron microscopy
Atoms
transmission electron microscopy
probes
atoms

ASJC Scopus subject areas

  • Instrumentation

Cite this

Techniques for consecutive TEM and Atom probe tomography analysis of nanowires. / Diercks, D. R.; Gorman, B. P.; Cheung, Chin Li "Barry"; Wang, G.

In: Microscopy and Microanalysis, Vol. 15, No. SUPPL. 2, 01.07.2009, p. 254-255.

Research output: Contribution to journalArticle

Diercks, D. R. ; Gorman, B. P. ; Cheung, Chin Li "Barry" ; Wang, G. / Techniques for consecutive TEM and Atom probe tomography analysis of nanowires. In: Microscopy and Microanalysis. 2009 ; Vol. 15, No. SUPPL. 2. pp. 254-255.
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