Superparamagnetic magnetic force microscopy tips

P. F. Hopkins, John Moreland, S. S. Malhotra, Sy-Hwang Liou

Research output: Contribution to journalArticle

30 Citations (Scopus)

Abstract

We report on magnetic force microscopy (MFM) images of a thin-film magnetic recording head taken using batch micromachined silicon tips coated with nanocomposite Fe60(SiO2)40 and Fe70(SiO2)30 films. The small Fe grain size (<10 nm) and dilute Fe volume fraction (0.29-0.4) of these granular films produce tip coatings of low remanence and essentially zero coercivity, reduced ; by the superparamagnetic properties of these films. We have used these tips to obtain MFM images of the write field of the head with high spatial and magnetic-field resolution. In comparison to images taken using commercial Co85Cr15-coated tips, these MFM images show reduced tip memory effects and clearly delineate the gap field from the pole pieces.

Original languageEnglish (US)
Pages (from-to)6448-6450
Number of pages3
JournalJournal of Applied Physics
Volume79
Issue number8 PART 2B
StatePublished - Apr 15 1996

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magnetic force microscopy
recording heads
magnetic recording
remanence
coercivity
nanocomposites
poles
grain size
coatings
silicon
thin films
magnetic fields

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Hopkins, P. F., Moreland, J., Malhotra, S. S., & Liou, S-H. (1996). Superparamagnetic magnetic force microscopy tips. Journal of Applied Physics, 79(8 PART 2B), 6448-6450.

Superparamagnetic magnetic force microscopy tips. / Hopkins, P. F.; Moreland, John; Malhotra, S. S.; Liou, Sy-Hwang.

In: Journal of Applied Physics, Vol. 79, No. 8 PART 2B, 15.04.1996, p. 6448-6450.

Research output: Contribution to journalArticle

Hopkins, PF, Moreland, J, Malhotra, SS & Liou, S-H 1996, 'Superparamagnetic magnetic force microscopy tips', Journal of Applied Physics, vol. 79, no. 8 PART 2B, pp. 6448-6450.
Hopkins PF, Moreland J, Malhotra SS, Liou S-H. Superparamagnetic magnetic force microscopy tips. Journal of Applied Physics. 1996 Apr 15;79(8 PART 2B):6448-6450.
Hopkins, P. F. ; Moreland, John ; Malhotra, S. S. ; Liou, Sy-Hwang. / Superparamagnetic magnetic force microscopy tips. In: Journal of Applied Physics. 1996 ; Vol. 79, No. 8 PART 2B. pp. 6448-6450.
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