Structural and magnetic properties of inverse opal photonic crystals studied by x-ray diffraction, scanning electron microscopy, and small-angle neutron scattering

S. V. Grigoriev, K. S. Napolskii, N. A. Grigoryeva, A. V. Vasilieva, A. A. Mistonov, D. Yu Chernyshov, A. V. Petukhov, D. V. Belov, A. A. Eliseev, A. V. Lukashin, Yu D. Tretyakov, A. S. Sinitskii, H. Eckerlebe

Research output: Contribution to journalArticle

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Abstract

The structural and magnetic properties of nickel inverse opal photonic crystal have been studied by complementary experimental techniques, including scanning electron microscopy, wide-angle and small-angle diffraction of synchrotron radiation, and polarized neutrons. The sample was fabricated by electrochemical deposition of nickel in voids in a colloidal crystal film made of 450 nm polystyrene microspheres followed by their dissolving in toluene. The microradian small-angle diffraction of synchrotron radiation was used to reveal the opal-like large-scale ordering proving its tendency to the face-centered-cubic (fcc) structure with the lattice constant of 650±10 nm. The wide-angle x-ray powder diffraction has shown that nanosize fcc nickel crystallites, which form an inverse opal framework, have some texture prescribed by principal directions in inverse opal on a macroscale, thus showing that the atomic and macroscopic structures are correlated. The polarized small-angle neutron scattering is used on the extreme limit of its ability to detect the transformation of the magnetic structure under applied field. Different contributions to the neutron scattering have been analyzed: the nonmagnetic (nuclear) one, the pure magnetic one, and the nuclear-magnetic interference. The latter in the diffraction pattern shows the degree of the spatial correlation between the magnetic and nuclear reflecting planes and gives the pattern behavior of the reversal magnetization process for these planes. The field dependence of pure magnetic contribution shows that the three-dimensional geometrical shape of the structure presumably leads to a complex distribution of the magnetization in the sample.

Original languageEnglish (US)
Article number045123
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume79
Issue number4
DOIs
StatePublished - Jan 5 2009

Fingerprint

Neutron scattering
Photonic crystals
Nickel
Structural properties
Magnetic properties
neutron scattering
x ray diffraction
Diffraction
photonics
magnetic properties
Synchrotron radiation
X rays
Scanning electron microscopy
scanning electron microscopy
Magnetization
crystals
nickel
Magnetic structure
Polystyrenes
Toluene

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Structural and magnetic properties of inverse opal photonic crystals studied by x-ray diffraction, scanning electron microscopy, and small-angle neutron scattering. / Grigoriev, S. V.; Napolskii, K. S.; Grigoryeva, N. A.; Vasilieva, A. V.; Mistonov, A. A.; Chernyshov, D. Yu; Petukhov, A. V.; Belov, D. V.; Eliseev, A. A.; Lukashin, A. V.; Tretyakov, Yu D.; Sinitskii, A. S.; Eckerlebe, H.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 79, No. 4, 045123, 05.01.2009.

Research output: Contribution to journalArticle

Grigoriev, SV, Napolskii, KS, Grigoryeva, NA, Vasilieva, AV, Mistonov, AA, Chernyshov, DY, Petukhov, AV, Belov, DV, Eliseev, AA, Lukashin, AV, Tretyakov, YD, Sinitskii, AS & Eckerlebe, H 2009, 'Structural and magnetic properties of inverse opal photonic crystals studied by x-ray diffraction, scanning electron microscopy, and small-angle neutron scattering', Physical Review B - Condensed Matter and Materials Physics, vol. 79, no. 4, 045123. https://doi.org/10.1103/PhysRevB.79.045123
Grigoriev, S. V. ; Napolskii, K. S. ; Grigoryeva, N. A. ; Vasilieva, A. V. ; Mistonov, A. A. ; Chernyshov, D. Yu ; Petukhov, A. V. ; Belov, D. V. ; Eliseev, A. A. ; Lukashin, A. V. ; Tretyakov, Yu D. ; Sinitskii, A. S. ; Eckerlebe, H. / Structural and magnetic properties of inverse opal photonic crystals studied by x-ray diffraction, scanning electron microscopy, and small-angle neutron scattering. In: Physical Review B - Condensed Matter and Materials Physics. 2009 ; Vol. 79, No. 4.
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