Stress-Induced Frequency Shifts of Degenerate Thickness-Shear Modes in Rotated Y-Cut Quartz Resonators

John A. Kosinski, Robert A. Pastore, Jiashi Yang, Xiaomeng Yang, Joseph A Turner

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

We study stress-induced frequency shifts in a rotated Y-cut quartz resonator (θ = 23.7°) with degenerate fundamental thickness-shear modes when the biasing stress is not present. Using the recently derived perturbation procedure for degenerate frequencies in crystal resonators, we show that when a planar stress system is applied, the degenerate frequency splits into two. This phenomenon is expected to be typical for degenerate frequencies in crystal resonators and may be responsible in part for the jump discontinuities in frequency temperature curves and other frequency jump phenomena.

Original languageEnglish (US)
Pages (from-to)1880-1883
Number of pages4
JournalIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume57
Issue number8
DOIs
StatePublished - 2010

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Crystal resonators
frequency shift
Quartz
Resonators
quartz
resonators
shear
crystals
discontinuity
Temperature
perturbation
curves

ASJC Scopus subject areas

  • Instrumentation
  • Acoustics and Ultrasonics
  • Electrical and Electronic Engineering

Cite this

Stress-Induced Frequency Shifts of Degenerate Thickness-Shear Modes in Rotated Y-Cut Quartz Resonators. / Kosinski, John A.; Pastore, Robert A.; Yang, Jiashi; Yang, Xiaomeng; Turner, Joseph A.

In: IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, Vol. 57, No. 8, 2010, p. 1880-1883.

Research output: Contribution to journalArticle

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