Stress-Induced Frequency Shifts of Degenerate Thickness-Shear Modes in Rotated Y-Cut Quartz Resonators

John A. Kosinski, Robert A. Pastore, Jiashi Yang, Xiaomeng Yang, Joseph A. Turner

Research output: Contribution to journalArticle

5 Scopus citations


We study stress-induced frequency shifts in a rotated Y-cut quartz resonator (θ = 23.7°) with degenerate fundamental thickness-shear modes when the biasing stress is not present. Using the recently derived perturbation procedure for degenerate frequencies in crystal resonators, we show that when a planar stress system is applied, the degenerate frequency splits into two. This phenomenon is expected to be typical for degenerate frequencies in crystal resonators and may be responsible in part for the jump discontinuities in frequency temperature curves and other frequency jump phenomena.

Original languageEnglish (US)
Pages (from-to)1880-1883
Number of pages4
JournalIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Issue number8
Publication statusPublished - Aug 2010


ASJC Scopus subject areas

  • Instrumentation
  • Acoustics and Ultrasonics
  • Electrical and Electronic Engineering

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