Stress-induced frequency shifts in langasite thickness-mode resonators

J. A. Kosinski, R. A. Pastore, X. Yang, J. Yang, J. A. Turner

Research output: Contribution to journalConference article

10 Citations (Scopus)

Abstract

In this paper, we report on our study of stress-induced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly-rotated, specified by angles φ and θ. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on φ and θ is calculated and examined, and loci of stress-compensation are determined. The analysis makes use of the third-order material constants that are available for langasite but not for its isomorphs.

Original languageEnglish (US)
Pages (from-to)716-722
Number of pages7
JournalProceedings of the Annual IEEE International Frequency Control Symposium
StatePublished - Dec 1 2003
EventProceedings of the 2003 IEEE International Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum - Tampa, FL., United States
Duration: May 4 2003May 8 2003

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Resonators
Compensation and Redress

Keywords

  • Langasite
  • Stress-induced effects

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Cite this

Stress-induced frequency shifts in langasite thickness-mode resonators. / Kosinski, J. A.; Pastore, R. A.; Yang, X.; Yang, J.; Turner, J. A.

In: Proceedings of the Annual IEEE International Frequency Control Symposium, 01.12.2003, p. 716-722.

Research output: Contribution to journalConference article

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