Stress-induced frequency shifts in langasite thickness-mode resonators

John A. Kosinski, Robert A. Pastore, Xiaomeng Yang, Jiashi Yang, Joseph A. Turner

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

In this paper, we report on our study of stressinduced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly rotated, specified by angles φ and θ. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on φ and θ is calculated and examined, and loci of stress-compensation are determined.

Original languageEnglish (US)
Article number4775271
Pages (from-to)129-135
Number of pages7
JournalIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume56
Issue number1
DOIs
StatePublished - Jan 1 2009

Fingerprint

frequency shift
Resonators
resonators
loci
perturbation
vibration
Compensation and Redress

ASJC Scopus subject areas

  • Instrumentation
  • Acoustics and Ultrasonics
  • Electrical and Electronic Engineering

Cite this

Stress-induced frequency shifts in langasite thickness-mode resonators. / Kosinski, John A.; Pastore, Robert A.; Yang, Xiaomeng; Yang, Jiashi; Turner, Joseph A.

In: IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, Vol. 56, No. 1, 4775271, 01.01.2009, p. 129-135.

Research output: Contribution to journalArticle

Kosinski, John A. ; Pastore, Robert A. ; Yang, Xiaomeng ; Yang, Jiashi ; Turner, Joseph A. / Stress-induced frequency shifts in langasite thickness-mode resonators. In: IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control. 2009 ; Vol. 56, No. 1. pp. 129-135.
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