Self-organizing microstructures orientation control in femtosecond laser patterning on silicon surface

Pengjun Liu, Lan Jiang, Jie Hu, Shuai Zhang, Yongfeng Lu

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

Self-organizing rippled microstructures are induced on silicon surface by linearly polarized femtosecond laser pulses. At a near threshold fluence, it is observed that ripple orientation is co-determined by the laser polarization direction and laser scanning parameters (scanning direction and scanning speed) in surface patterning process. Under fixed laser polarization, the ripple orientation can be controlled to rotate by about 40° through changing laser scanning parameters. In addition, it is also observed that the ripple morphology is sensitive to the laser scanning direction, and it is an optimal choice to obtain ordered ripple structures when the angle between laser scanning and laser polarization is less than 45°.

Original languageEnglish (US)
Pages (from-to)16669-16675
Number of pages7
JournalOptics Express
Volume22
Issue number14
DOIs
StatePublished - Jan 1 2014

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organizing
microstructure
silicon
ripples
lasers
scanning
polarization
fluence
thresholds
pulses

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Self-organizing microstructures orientation control in femtosecond laser patterning on silicon surface. / Liu, Pengjun; Jiang, Lan; Hu, Jie; Zhang, Shuai; Lu, Yongfeng.

In: Optics Express, Vol. 22, No. 14, 01.01.2014, p. 16669-16675.

Research output: Contribution to journalArticle

Liu, Pengjun ; Jiang, Lan ; Hu, Jie ; Zhang, Shuai ; Lu, Yongfeng. / Self-organizing microstructures orientation control in femtosecond laser patterning on silicon surface. In: Optics Express. 2014 ; Vol. 22, No. 14. pp. 16669-16675.
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