Scanning the Issue

I. F. Akyildiz, M. Pierobon, S. Balasubramaniam, J. Zhang, T. Chen, S. Zhong, J. Wang, W. Zhang, X. Zuo, R. G. Maunder, L. Hanzo, J. Chen, J. Liu, V. D. Calhoun, A. B. Magoun

Research output: Contribution to journalEditorial

Original languageEnglish (US)
Article number8710358
Pages (from-to)866-867
Number of pages2
JournalProceedings of the IEEE
Issue number5
StatePublished - May 2019



ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Akyildiz, I. F., Pierobon, M., Balasubramaniam, S., Zhang, J., Chen, T., Zhong, S., ... Magoun, A. B. (2019). Scanning the Issue. Proceedings of the IEEE, 107(5), 866-867. [8710358].

Scanning the Issue. / Akyildiz, I. F.; Pierobon, M.; Balasubramaniam, S.; Zhang, J.; Chen, T.; Zhong, S.; Wang, J.; Zhang, W.; Zuo, X.; Maunder, R. G.; Hanzo, L.; Chen, J.; Liu, J.; Calhoun, V. D.; Magoun, A. B.

In: Proceedings of the IEEE, Vol. 107, No. 5, 8710358, 05.2019, p. 866-867.

Research output: Contribution to journalEditorial

Akyildiz, IF, Pierobon, M, Balasubramaniam, S, Zhang, J, Chen, T, Zhong, S, Wang, J, Zhang, W, Zuo, X, Maunder, RG, Hanzo, L, Chen, J, Liu, J, Calhoun, VD & Magoun, AB 2019, 'Scanning the Issue', Proceedings of the IEEE, vol. 107, no. 5, 8710358, pp. 866-867.
Akyildiz IF, Pierobon M, Balasubramaniam S, Zhang J, Chen T, Zhong S et al. Scanning the Issue. Proceedings of the IEEE. 2019 May;107(5):866-867. 8710358.
Akyildiz, I. F. ; Pierobon, M. ; Balasubramaniam, S. ; Zhang, J. ; Chen, T. ; Zhong, S. ; Wang, J. ; Zhang, W. ; Zuo, X. ; Maunder, R. G. ; Hanzo, L. ; Chen, J. ; Liu, J. ; Calhoun, V. D. ; Magoun, A. B. / Scanning the Issue. In: Proceedings of the IEEE. 2019 ; Vol. 107, No. 5. pp. 866-867.
title = "Scanning the Issue",
author = "Akyildiz, {I. F.} and M. Pierobon and S. Balasubramaniam and J. Zhang and T. Chen and S. Zhong and J. Wang and W. Zhang and X. Zuo and Maunder, {R. G.} and L. Hanzo and J. Chen and J. Liu and Calhoun, {V. D.} and Magoun, {A. B.}",
year = "2019",
month = "5",
doi = "10.1109/JPROC.2019.2913137",
language = "English (US)",
volume = "107",
pages = "866--867",
journal = "Proceedings of the IEEE",
issn = "0018-9219",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "5",



T1 - Scanning the Issue

AU - Akyildiz, I. F.

AU - Pierobon, M.

AU - Balasubramaniam, S.

AU - Zhang, J.

AU - Chen, T.

AU - Zhong, S.

AU - Wang, J.

AU - Zhang, W.

AU - Zuo, X.

AU - Maunder, R. G.

AU - Hanzo, L.

AU - Chen, J.

AU - Liu, J.

AU - Calhoun, V. D.

AU - Magoun, A. B.

PY - 2019/5

Y1 - 2019/5

UR -

UR -

U2 - 10.1109/JPROC.2019.2913137

DO - 10.1109/JPROC.2019.2913137

M3 - Editorial

AN - SCOPUS:85065621664

VL - 107

SP - 866

EP - 867

JO - Proceedings of the IEEE

JF - Proceedings of the IEEE

SN - 0018-9219

IS - 5

M1 - 8710358

ER -