Scanning electron microscope identification of weak links in superconducting thin films

Don Monroe, W. S. Brocklesby, R. C. Farrow, M. Hong, Sy-Hwang Liou

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

We have used a pulsed electron beam in a scanning electron microscope to produce highly localized (∼1 μm) changes in the electrical properties of a heterogeneous thin film of YBa2Cu3O7-δ. The predominant effect of the beam is to locally heat the film, producing a measurable shift in the current-voltage characteristic. In particular, we have precisely located the part of the film responsible for a sharp feature in the current-voltage characteristic corresponding to a single Josephson junction. The technique should also be useful more generally in identifying specific weak links in superconducting thin films.

Original languageEnglish (US)
Pages (from-to)1210-1212
Number of pages3
JournalApplied Physics Letters
Volume53
Issue number13
DOIs
StatePublished - Dec 1 1988

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electron microscopes
scanning
electric potential
thin films
Josephson junctions
electrical properties
electron beams
heat
shift

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Scanning electron microscope identification of weak links in superconducting thin films. / Monroe, Don; Brocklesby, W. S.; Farrow, R. C.; Hong, M.; Liou, Sy-Hwang.

In: Applied Physics Letters, Vol. 53, No. 13, 01.12.1988, p. 1210-1212.

Research output: Contribution to journalArticle

Monroe, Don ; Brocklesby, W. S. ; Farrow, R. C. ; Hong, M. ; Liou, Sy-Hwang. / Scanning electron microscope identification of weak links in superconducting thin films. In: Applied Physics Letters. 1988 ; Vol. 53, No. 13. pp. 1210-1212.
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