Revealing stacking sequences in inverse opals by microradian X-ray diffraction

A. Sinitskii, V. Abramova, N. Grigorieva, S. Grigoriev, A. Snigirev, D. V. Byelov, A. V. Petukhov

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

We present the results of the structural analysis of inverse opal photonic crystals by microradian X-ray diffraction. Inverse opals based on different oxide materials (TiO2, SiO2 and Fe2O 3) were fabricated by templating polystyrene colloidal crystal films grown by the vertical deposition technique. Our results suggest that most inverse opal films possess dominating twinned face-centered cubic structure accompanied by some fragments of hexagonal close-packed and random hexagonal close-packed structures. The studied samples possessed individual structures with different ratios of the above fragments. By fitting the results of the angular-dependent X-ray diffraction by the Wilson model we estimate the stacking probability α in the studied samples to be ∼0.7-0.8. Microradian X-ray diffraction therefore provides detailed structural information on opal-based photonic crystals and can be applied to opaque inverse opals or the samples with a periodicity <300 nm, whose structure cannot be investigated by conventional optical methods.

Original languageEnglish (US)
Article number14002
JournalEPL
Volume89
Issue number1
DOIs
StatePublished - Feb 18 2010

Fingerprint

diffraction
fragments
photonics
crystals
x rays
structural analysis
periodic variations
polystyrene
optics
oxides
estimates

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Sinitskii, A., Abramova, V., Grigorieva, N., Grigoriev, S., Snigirev, A., Byelov, D. V., & Petukhov, A. V. (2010). Revealing stacking sequences in inverse opals by microradian X-ray diffraction. EPL, 89(1), [14002]. https://doi.org/10.1209/0295-5075/89/14002

Revealing stacking sequences in inverse opals by microradian X-ray diffraction. / Sinitskii, A.; Abramova, V.; Grigorieva, N.; Grigoriev, S.; Snigirev, A.; Byelov, D. V.; Petukhov, A. V.

In: EPL, Vol. 89, No. 1, 14002, 18.02.2010.

Research output: Contribution to journalArticle

Sinitskii, A, Abramova, V, Grigorieva, N, Grigoriev, S, Snigirev, A, Byelov, DV & Petukhov, AV 2010, 'Revealing stacking sequences in inverse opals by microradian X-ray diffraction', EPL, vol. 89, no. 1, 14002. https://doi.org/10.1209/0295-5075/89/14002
Sinitskii A, Abramova V, Grigorieva N, Grigoriev S, Snigirev A, Byelov DV et al. Revealing stacking sequences in inverse opals by microradian X-ray diffraction. EPL. 2010 Feb 18;89(1). 14002. https://doi.org/10.1209/0295-5075/89/14002
Sinitskii, A. ; Abramova, V. ; Grigorieva, N. ; Grigoriev, S. ; Snigirev, A. ; Byelov, D. V. ; Petukhov, A. V. / Revealing stacking sequences in inverse opals by microradian X-ray diffraction. In: EPL. 2010 ; Vol. 89, No. 1.
@article{4fa40988cfd2486abf9995a79237e573,
title = "Revealing stacking sequences in inverse opals by microradian X-ray diffraction",
abstract = "We present the results of the structural analysis of inverse opal photonic crystals by microradian X-ray diffraction. Inverse opals based on different oxide materials (TiO2, SiO2 and Fe2O 3) were fabricated by templating polystyrene colloidal crystal films grown by the vertical deposition technique. Our results suggest that most inverse opal films possess dominating twinned face-centered cubic structure accompanied by some fragments of hexagonal close-packed and random hexagonal close-packed structures. The studied samples possessed individual structures with different ratios of the above fragments. By fitting the results of the angular-dependent X-ray diffraction by the Wilson model we estimate the stacking probability α in the studied samples to be ∼0.7-0.8. Microradian X-ray diffraction therefore provides detailed structural information on opal-based photonic crystals and can be applied to opaque inverse opals or the samples with a periodicity <300 nm, whose structure cannot be investigated by conventional optical methods.",
author = "A. Sinitskii and V. Abramova and N. Grigorieva and S. Grigoriev and A. Snigirev and Byelov, {D. V.} and Petukhov, {A. V.}",
year = "2010",
month = "2",
day = "18",
doi = "10.1209/0295-5075/89/14002",
language = "English (US)",
volume = "89",
journal = "Europhysics Letters",
issn = "0295-5075",
publisher = "IOP Publishing Ltd.",
number = "1",

}

TY - JOUR

T1 - Revealing stacking sequences in inverse opals by microradian X-ray diffraction

AU - Sinitskii, A.

AU - Abramova, V.

AU - Grigorieva, N.

AU - Grigoriev, S.

AU - Snigirev, A.

AU - Byelov, D. V.

AU - Petukhov, A. V.

PY - 2010/2/18

Y1 - 2010/2/18

N2 - We present the results of the structural analysis of inverse opal photonic crystals by microradian X-ray diffraction. Inverse opals based on different oxide materials (TiO2, SiO2 and Fe2O 3) were fabricated by templating polystyrene colloidal crystal films grown by the vertical deposition technique. Our results suggest that most inverse opal films possess dominating twinned face-centered cubic structure accompanied by some fragments of hexagonal close-packed and random hexagonal close-packed structures. The studied samples possessed individual structures with different ratios of the above fragments. By fitting the results of the angular-dependent X-ray diffraction by the Wilson model we estimate the stacking probability α in the studied samples to be ∼0.7-0.8. Microradian X-ray diffraction therefore provides detailed structural information on opal-based photonic crystals and can be applied to opaque inverse opals or the samples with a periodicity <300 nm, whose structure cannot be investigated by conventional optical methods.

AB - We present the results of the structural analysis of inverse opal photonic crystals by microradian X-ray diffraction. Inverse opals based on different oxide materials (TiO2, SiO2 and Fe2O 3) were fabricated by templating polystyrene colloidal crystal films grown by the vertical deposition technique. Our results suggest that most inverse opal films possess dominating twinned face-centered cubic structure accompanied by some fragments of hexagonal close-packed and random hexagonal close-packed structures. The studied samples possessed individual structures with different ratios of the above fragments. By fitting the results of the angular-dependent X-ray diffraction by the Wilson model we estimate the stacking probability α in the studied samples to be ∼0.7-0.8. Microradian X-ray diffraction therefore provides detailed structural information on opal-based photonic crystals and can be applied to opaque inverse opals or the samples with a periodicity <300 nm, whose structure cannot be investigated by conventional optical methods.

UR - http://www.scopus.com/inward/record.url?scp=79051470742&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79051470742&partnerID=8YFLogxK

U2 - 10.1209/0295-5075/89/14002

DO - 10.1209/0295-5075/89/14002

M3 - Article

AN - SCOPUS:79051470742

VL - 89

JO - Europhysics Letters

JF - Europhysics Letters

SN - 0295-5075

IS - 1

M1 - 14002

ER -