Real-time space materials degradation monitor using ellipsometer

Hassanayn Machlab, R. A. Synowicki, Steven P. Ducharme, Paul G. Snyder, John A. Woollam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

NASA has a need for a simple, low-cost, compact, lightweight and rugged instrument to monitor materials degradation in the atomic oxygen (AO) environment of low Earth orbit (LEO). The purpose of the reported SBIR contract work was to build a space-fly able ellipsometer to meet these needs. The small modulation ellipsometer (SME) built uses polarization modulation and an arrangement of optical elements permitting simultaneous and continuous measurement of the ellipsometric parameters without reference to external calibration or to elaborate alignment procedures. This ellipsometer directly measures the most significant errors in system alignment that perhaps might occur at initial construction or during space launch. This ellipsometer contains no moving parts, requires only low electrical power, can work in vacuum conditions, and could be flight-qualified to be operable in space.

Original languageEnglish (US)
Title of host publicationSpace Programs and Technologies Conference
PublisherAmerican Institute of Aeronautics and Astronautics Inc, AIAA
Pages1-5
Number of pages5
ISBN (Print)9781623565244
StatePublished - Jan 1 1995
EventSpace Programs and Technologies Conference, 1995 - Reston, United States
Duration: Sep 26 1995Sep 28 1995

Publication series

Name1995 Space Programs and Technologies Conference

Other

OtherSpace Programs and Technologies Conference, 1995
CountryUnited States
CityReston
Period9/26/959/28/95

Fingerprint

ellipsometers
monitors
Modulation
degradation
Degradation
Optical devices
NASA
Orbits
electrical power
Earth (planet)
alignment
Calibration
Vacuum
Polarization
polarization modulation
Oxygen
low Earth orbits
polarization
flight
calibration

ASJC Scopus subject areas

  • Space and Planetary Science
  • Aerospace Engineering

Cite this

Machlab, H., Synowicki, R. A., Ducharme, S. P., Snyder, P. G., & Woollam, J. A. (1995). Real-time space materials degradation monitor using ellipsometer. In Space Programs and Technologies Conference (pp. 1-5). (1995 Space Programs and Technologies Conference). American Institute of Aeronautics and Astronautics Inc, AIAA.

Real-time space materials degradation monitor using ellipsometer. / Machlab, Hassanayn; Synowicki, R. A.; Ducharme, Steven P.; Snyder, Paul G.; Woollam, John A.

Space Programs and Technologies Conference. American Institute of Aeronautics and Astronautics Inc, AIAA, 1995. p. 1-5 (1995 Space Programs and Technologies Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Machlab, H, Synowicki, RA, Ducharme, SP, Snyder, PG & Woollam, JA 1995, Real-time space materials degradation monitor using ellipsometer. in Space Programs and Technologies Conference. 1995 Space Programs and Technologies Conference, American Institute of Aeronautics and Astronautics Inc, AIAA, pp. 1-5, Space Programs and Technologies Conference, 1995, Reston, United States, 9/26/95.
Machlab H, Synowicki RA, Ducharme SP, Snyder PG, Woollam JA. Real-time space materials degradation monitor using ellipsometer. In Space Programs and Technologies Conference. American Institute of Aeronautics and Astronautics Inc, AIAA. 1995. p. 1-5. (1995 Space Programs and Technologies Conference).
Machlab, Hassanayn ; Synowicki, R. A. ; Ducharme, Steven P. ; Snyder, Paul G. ; Woollam, John A. / Real-time space materials degradation monitor using ellipsometer. Space Programs and Technologies Conference. American Institute of Aeronautics and Astronautics Inc, AIAA, 1995. pp. 1-5 (1995 Space Programs and Technologies Conference).
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