Quantitative study of magnetoresistance in patterned Ni80Fe 20 wires

J. L. Tsai, J. H. Hsieh, T. Y. Chen, S. H. Liou, S. F. Lee, Y. D. Yao

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Abstract

The domain wall resistivity of the patterned Ni80Fe 20 zigzag wires has been studied as functions of the number of corners and temperature in zigzag wires. The quantitative ratio of domain wall magnetoresistance (MR) is estimated by two methods, One is the discontinuous jump that represent the domain state sweep between two states in MR curve. The other is the angular dependence on the resistance at remanent state. The ratio of domain wall MR increased when domain wall number density over total wire length (DWs/L) changed from 12/73 to 34/73 with film thickness 40 nm at 10-300 K. Especially, the ratio of domain wall MR decreased slightly as the temperature ranged from 10 to 300 K. The anisotropic magnetoresistance (AMR) has been subtracted in the calculation.

Original languageEnglish (US)
Pages (from-to)1581-1584
Number of pages4
JournalPhysica Status Solidi (B) Basic Research
Volume241
Issue number7
DOIs
StatePublished - Jun 1 2004

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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