Quantitative study of magnetoresistance in patterned Ni80Fe 20 wires

J. L. Tsai, J. H. Hsieh, T. Y. Chen, Sy-Hwang Liou, S. F. Lee, Y. D. Yao

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The domain wall resistivity of the patterned Ni80Fe 20 zigzag wires has been studied as functions of the number of corners and temperature in zigzag wires. The quantitative ratio of domain wall magnetoresistance (MR) is estimated by two methods, One is the discontinuous jump that represent the domain state sweep between two states in MR curve. The other is the angular dependence on the resistance at remanent state. The ratio of domain wall MR increased when domain wall number density over total wire length (DWs/L) changed from 12/73 to 34/73 with film thickness 40 nm at 10-300 K. Especially, the ratio of domain wall MR decreased slightly as the temperature ranged from 10 to 300 K. The anisotropic magnetoresistance (AMR) has been subtracted in the calculation.

Original languageEnglish (US)
Pages (from-to)1581-1584
Number of pages4
JournalPhysica Status Solidi (B) Basic Research
Volume241
Issue number7
DOIs
StatePublished - Jun 1 2004

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Domain walls
Magnetoresistance
domain wall
wire
Wire
Enhanced magnetoresistance
Film thickness
film thickness
Temperature
electrical resistivity
temperature
curves

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Quantitative study of magnetoresistance in patterned Ni80Fe 20 wires. / Tsai, J. L.; Hsieh, J. H.; Chen, T. Y.; Liou, Sy-Hwang; Lee, S. F.; Yao, Y. D.

In: Physica Status Solidi (B) Basic Research, Vol. 241, No. 7, 01.06.2004, p. 1581-1584.

Research output: Contribution to journalArticle

Tsai, J. L. ; Hsieh, J. H. ; Chen, T. Y. ; Liou, Sy-Hwang ; Lee, S. F. ; Yao, Y. D. / Quantitative study of magnetoresistance in patterned Ni80Fe 20 wires. In: Physica Status Solidi (B) Basic Research. 2004 ; Vol. 241, No. 7. pp. 1581-1584.
@article{4f16be4076574f428192c0bf0fa9ce8b,
title = "Quantitative study of magnetoresistance in patterned Ni80Fe 20 wires",
abstract = "The domain wall resistivity of the patterned Ni80Fe 20 zigzag wires has been studied as functions of the number of corners and temperature in zigzag wires. The quantitative ratio of domain wall magnetoresistance (MR) is estimated by two methods, One is the discontinuous jump that represent the domain state sweep between two states in MR curve. The other is the angular dependence on the resistance at remanent state. The ratio of domain wall MR increased when domain wall number density over total wire length (DWs/L) changed from 12/73 to 34/73 with film thickness 40 nm at 10-300 K. Especially, the ratio of domain wall MR decreased slightly as the temperature ranged from 10 to 300 K. The anisotropic magnetoresistance (AMR) has been subtracted in the calculation.",
author = "Tsai, {J. L.} and Hsieh, {J. H.} and Chen, {T. Y.} and Sy-Hwang Liou and Lee, {S. F.} and Yao, {Y. D.}",
year = "2004",
month = "6",
day = "1",
doi = "10.1002/pssb.200304684",
language = "English (US)",
volume = "241",
pages = "1581--1584",
journal = "Physica Status Solidi (B): Basic Research",
issn = "0370-1972",
publisher = "Wiley-VCH Verlag",
number = "7",

}

TY - JOUR

T1 - Quantitative study of magnetoresistance in patterned Ni80Fe 20 wires

AU - Tsai, J. L.

AU - Hsieh, J. H.

AU - Chen, T. Y.

AU - Liou, Sy-Hwang

AU - Lee, S. F.

AU - Yao, Y. D.

PY - 2004/6/1

Y1 - 2004/6/1

N2 - The domain wall resistivity of the patterned Ni80Fe 20 zigzag wires has been studied as functions of the number of corners and temperature in zigzag wires. The quantitative ratio of domain wall magnetoresistance (MR) is estimated by two methods, One is the discontinuous jump that represent the domain state sweep between two states in MR curve. The other is the angular dependence on the resistance at remanent state. The ratio of domain wall MR increased when domain wall number density over total wire length (DWs/L) changed from 12/73 to 34/73 with film thickness 40 nm at 10-300 K. Especially, the ratio of domain wall MR decreased slightly as the temperature ranged from 10 to 300 K. The anisotropic magnetoresistance (AMR) has been subtracted in the calculation.

AB - The domain wall resistivity of the patterned Ni80Fe 20 zigzag wires has been studied as functions of the number of corners and temperature in zigzag wires. The quantitative ratio of domain wall magnetoresistance (MR) is estimated by two methods, One is the discontinuous jump that represent the domain state sweep between two states in MR curve. The other is the angular dependence on the resistance at remanent state. The ratio of domain wall MR increased when domain wall number density over total wire length (DWs/L) changed from 12/73 to 34/73 with film thickness 40 nm at 10-300 K. Especially, the ratio of domain wall MR decreased slightly as the temperature ranged from 10 to 300 K. The anisotropic magnetoresistance (AMR) has been subtracted in the calculation.

UR - http://www.scopus.com/inward/record.url?scp=4644260165&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=4644260165&partnerID=8YFLogxK

U2 - 10.1002/pssb.200304684

DO - 10.1002/pssb.200304684

M3 - Article

VL - 241

SP - 1581

EP - 1584

JO - Physica Status Solidi (B): Basic Research

JF - Physica Status Solidi (B): Basic Research

SN - 0370-1972

IS - 7

ER -