Quantitative oscillator analysis of IR-optical spectra on spin-cast chitosan films

W. H. Nosal, D. W. Thompson, S. Sarkar, Anuradha Subramanian, John A Woollam

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Infrared optical properties of spin-cast chitosan films have been determined using spectroscopic ellipsometry. Infrared index of refraction and extinction coefficients from 750 cm-1 to 4000 cm-1 were determined using ellipsometric data fits to dispersion models based on Gaussian shaped oscillators. The free electron contribution was analyzed using a Drude model. This modeling determined that optical anisotropy was present over the entire infrared region. Line shape and oscillator strength analysis was performed to determine oscillator strengths, abundance, and relative bond strength.

Original languageEnglish (US)
Pages (from-to)267-274
Number of pages8
JournalSpectroscopy
Volume19
Issue number5-6
StatePublished - Dec 1 2005

Fingerprint

Chitosan
Infrared radiation
Optical anisotropy
Light extinction
Spectroscopic ellipsometry
Refraction
Optical properties
Electrons

Keywords

  • Bond occurrence
  • Chitosan
  • Ellipsometry
  • Infrared spectrum
  • Oscillator strength

ASJC Scopus subject areas

  • Spectroscopy

Cite this

Quantitative oscillator analysis of IR-optical spectra on spin-cast chitosan films. / Nosal, W. H.; Thompson, D. W.; Sarkar, S.; Subramanian, Anuradha; Woollam, John A.

In: Spectroscopy, Vol. 19, No. 5-6, 01.12.2005, p. 267-274.

Research output: Contribution to journalArticle

Nosal, W. H. ; Thompson, D. W. ; Sarkar, S. ; Subramanian, Anuradha ; Woollam, John A. / Quantitative oscillator analysis of IR-optical spectra on spin-cast chitosan films. In: Spectroscopy. 2005 ; Vol. 19, No. 5-6. pp. 267-274.
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