Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry

L. M. Karlsson, M. Schubert, N. Ashkenov, H. Arwin

Research output: Contribution to journalConference article

29 Citations (Scopus)

Abstract

Porous silicon layers with a one-dimensional lateral gradient in pore size are prepared by electrochemical etching and characterized by spectroscopic ellipsometry in the visible to near-infrared region. The ellipsometer is equipped with a micro-spot option giving a lateral resolution of approximately 100 μm. By matching multiple-layer-model calculations to the laterally-resolved variable angle of incidence spectroscopic ellipsometry data, the thickness variation along the gradient as well as the in-depth porosity profile is mapped. Upon exposure to a protein solution, protein adsorption occurs on top of the porous silicon layer. At the high-porosity region of the gradient also penetration of protein molecules into the porous layer takes place. Ellipsometry data are recorded after protein exposure and variations of protein adsorption along the porous silicon gradient is modeled as well as the in-depth profile of protein penetration.

Original languageEnglish (US)
Pages (from-to)726-730
Number of pages5
JournalThin Solid Films
Volume455-456
DOIs
StatePublished - May 1 2004
EventThe 3rd International Conference on Spectroscopic Ellipsometry - Vienna, Austria
Duration: Jul 6 2003Jul 11 2003

Fingerprint

Spectroscopic ellipsometry
Porous silicon
porous silicon
ellipsometry
proteins
Proteins
Adsorption
gradients
adsorption
porosity
penetration
Porosity
Electrochemical etching
ellipsometers
Ellipsometry
profiles
Pore size
incidence
etching
Infrared radiation

Keywords

  • Porous silicon
  • Protein adsorption
  • Spatially-resolved spectroscopic ellipsometry

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry. / Karlsson, L. M.; Schubert, M.; Ashkenov, N.; Arwin, H.

In: Thin Solid Films, Vol. 455-456, 01.05.2004, p. 726-730.

Research output: Contribution to journalConference article

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AB - Porous silicon layers with a one-dimensional lateral gradient in pore size are prepared by electrochemical etching and characterized by spectroscopic ellipsometry in the visible to near-infrared region. The ellipsometer is equipped with a micro-spot option giving a lateral resolution of approximately 100 μm. By matching multiple-layer-model calculations to the laterally-resolved variable angle of incidence spectroscopic ellipsometry data, the thickness variation along the gradient as well as the in-depth porosity profile is mapped. Upon exposure to a protein solution, protein adsorption occurs on top of the porous silicon layer. At the high-porosity region of the gradient also penetration of protein molecules into the porous layer takes place. Ellipsometry data are recorded after protein exposure and variations of protein adsorption along the porous silicon gradient is modeled as well as the in-depth profile of protein penetration.

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