Polaron and phonon properties in proton intercalated amorphous tungsten oxide thin films

M. F. Saenger, T. Höing, B. W. Robertson, R. B. Billa, T. Hofmann, E. Schubert, M. Schubert

Research output: Contribution to journalArticle

34 Citations (Scopus)

Abstract

We report on the evolution of the polaron and phonon mode properties in amorphous tungsten oxide thin films measured by spectroscopic ellipsometry in the infrared to ultraviolet spectral regions as a function of the intercalated proton density. A parametric physical model dielectric function is presented, which excellently describes the ellipsometry data over a large intercalated charge-density range. Upon increased amounts of intercalated charge we observe a strong increase in the polaron absorption in the visible spectral range, a decrease in the infrared W-O bond polarity, and an increase in the W=O bond polarity. Our findings support the oxygen-extraction model as the polaron formation mechanism in tungsten oxide in agreement with previous theoretical works based on first-principles pseudopotential calculations. We discuss and suggest polaron formation by oxygen-related defect generation as origin for the coloration mechanism in tungsten oxide. We further discuss possible evidence for very large effective mass of the polarons within the insulator-to-metal transition regime.

Original languageEnglish (US)
Article number245205
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume78
Issue number24
DOIs
StatePublished - Dec 1 2008

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Gene Conversion
tungsten oxides
Oxide films
Tungsten
Protons
Thin films
ellipsometry
protons
polarity
thin films
Infrared radiation
Polarons
Oxides
Oxygen
Spectroscopic ellipsometry
Ellipsometry
polarons
oxygen
Charge density
pseudopotentials

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Polaron and phonon properties in proton intercalated amorphous tungsten oxide thin films. / Saenger, M. F.; Höing, T.; Robertson, B. W.; Billa, R. B.; Hofmann, T.; Schubert, E.; Schubert, M.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 78, No. 24, 245205, 01.12.2008.

Research output: Contribution to journalArticle

Saenger, M. F. ; Höing, T. ; Robertson, B. W. ; Billa, R. B. ; Hofmann, T. ; Schubert, E. ; Schubert, M. / Polaron and phonon properties in proton intercalated amorphous tungsten oxide thin films. In: Physical Review B - Condensed Matter and Materials Physics. 2008 ; Vol. 78, No. 24.
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