Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems

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Abstract

We present a unified theoretical approach to electromagnetic plane waves reflected or transmitted at arbitrarily anisotropic and homogeneous layered systems. Analytic expressions for the eigenvalues for the four-wave components inside a randomly oriented anisotropic medium are reported explicitly. As well, the partial transfer matrix for a slab of a continuously twisted biaxial material at normal incidence is described. Transition matrices for the incident and exit media are presented. Hence, a complete analytical 4×4 matrix algorithm is obtained using Berreman’s 4×4 differential matrices [D. W. Berreman, J. Opt. Soc. Am. 62, 502 (1972)]. The algorithm has a general approach for materials with linear optical response behavior and can be used immediately, for example, to analyze ellipsometric investigations.

Original languageEnglish (US)
Pages (from-to)4265-4274
Number of pages10
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume53
Issue number8
DOIs
StatePublished - Jan 1 1996

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Polarization
anisotropic media
polarization
matrices
slabs
plane waves
eigenvalues
incidence
electromagnetism
Anisotropic media

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

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abstract = "We present a unified theoretical approach to electromagnetic plane waves reflected or transmitted at arbitrarily anisotropic and homogeneous layered systems. Analytic expressions for the eigenvalues for the four-wave components inside a randomly oriented anisotropic medium are reported explicitly. As well, the partial transfer matrix for a slab of a continuously twisted biaxial material at normal incidence is described. Transition matrices for the incident and exit media are presented. Hence, a complete analytical 4×4 matrix algorithm is obtained using Berreman’s 4×4 differential matrices [D. W. Berreman, J. Opt. Soc. Am. 62, 502 (1972)]. The algorithm has a general approach for materials with linear optical response behavior and can be used immediately, for example, to analyze ellipsometric investigations.",
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AB - We present a unified theoretical approach to electromagnetic plane waves reflected or transmitted at arbitrarily anisotropic and homogeneous layered systems. Analytic expressions for the eigenvalues for the four-wave components inside a randomly oriented anisotropic medium are reported explicitly. As well, the partial transfer matrix for a slab of a continuously twisted biaxial material at normal incidence is described. Transition matrices for the incident and exit media are presented. Hence, a complete analytical 4×4 matrix algorithm is obtained using Berreman’s 4×4 differential matrices [D. W. Berreman, J. Opt. Soc. Am. 62, 502 (1972)]. The algorithm has a general approach for materials with linear optical response behavior and can be used immediately, for example, to analyze ellipsometric investigations.

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