Pattern-driven visual search for multiple defects

Anpin Max Chin, Ram R. Bishu

Research output: Contribution to journalConference article

Abstract

A simulation task for circuit-board inspection was designed with different image patterns to analyze inspectors' search strategies including the scan-path and the stopping policy. This study focused on how people fixate and locate defects, and the subsequent decision making processes. According to Gestalt laws of organization, a complex searching field would be decomposed in groups for separate scans. The analysis of scan-path shows that subjects had their own respective search pattern for all trials. Although the scan-paths were found different, search behavior within image patterns were similar across subjects. It implies that the visual search is driven by image patterns.

Original languageEnglish (US)
Pages (from-to)1102-1106
Number of pages5
JournalProceedings of the Human Factors and Ergonomics Society
Volume2
StatePublished - Jan 1 1996
EventProceedings of the 1996 40th Annual Meeting of the Human Factors and Ergonomics Society. Part 1 (of 2) - Philadelphia, PA, USA
Duration: Sep 2 1996Sep 6 1996

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Inspection
Decision making
Defects
Networks (circuits)
decision making process
organization
simulation
Law
Group

ASJC Scopus subject areas

  • Human Factors and Ergonomics

Cite this

Pattern-driven visual search for multiple defects. / Max Chin, Anpin; Bishu, Ram R.

In: Proceedings of the Human Factors and Ergonomics Society, Vol. 2, 01.01.1996, p. 1102-1106.

Research output: Contribution to journalConference article

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