Oscillatory interlayer coupling with Cu and Zr underlayer thickness for Co/Cu multilayers

Tong Yun Zhao, Zheng Sheng Shan, Bao Gen Shen, Jian Gao Zhao, D. J. Sellmyer

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Oscillatory behavior (with a period of about 9nm) of antiferromagnetic coupling with the thicknesses of Cu and Zr underlayers is reported for sputtered Co(1 nm)/Cu(2.3 nm) multilayers. The related oscillation of magnetoresistance is also observed. Based on the analysis of X-ray diffraction patterns, the variation of crystallographic orientation and modulation period is proved not responsible to the phenomenon. But the underlayer strongly affects the growth orientation of multilayer.

Original languageEnglish (US)
Pages (from-to)613-617
Number of pages5
JournalChinese Physics
Volume7
Issue number8
StatePublished - Aug 1 1998

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interlayers
diffraction patterns
modulation
oscillations
x rays

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Oscillatory interlayer coupling with Cu and Zr underlayer thickness for Co/Cu multilayers. / Zhao, Tong Yun; Shan, Zheng Sheng; Shen, Bao Gen; Zhao, Jian Gao; Sellmyer, D. J.

In: Chinese Physics, Vol. 7, No. 8, 01.08.1998, p. 613-617.

Research output: Contribution to journalArticle

Zhao, Tong Yun ; Shan, Zheng Sheng ; Shen, Bao Gen ; Zhao, Jian Gao ; Sellmyer, D. J. / Oscillatory interlayer coupling with Cu and Zr underlayer thickness for Co/Cu multilayers. In: Chinese Physics. 1998 ; Vol. 7, No. 8. pp. 613-617.
@article{4f6159f704744b74be150498087e4811,
title = "Oscillatory interlayer coupling with Cu and Zr underlayer thickness for Co/Cu multilayers",
abstract = "Oscillatory behavior (with a period of about 9nm) of antiferromagnetic coupling with the thicknesses of Cu and Zr underlayers is reported for sputtered Co(1 nm)/Cu(2.3 nm) multilayers. The related oscillation of magnetoresistance is also observed. Based on the analysis of X-ray diffraction patterns, the variation of crystallographic orientation and modulation period is proved not responsible to the phenomenon. But the underlayer strongly affects the growth orientation of multilayer.",
author = "Zhao, {Tong Yun} and Shan, {Zheng Sheng} and Shen, {Bao Gen} and Zhao, {Jian Gao} and Sellmyer, {D. J.}",
year = "1998",
month = "8",
day = "1",
language = "English (US)",
volume = "7",
pages = "613--617",
journal = "Chinese Physics",
issn = "1009-1963",
publisher = "IOP Publishing Ltd.",
number = "8",

}

TY - JOUR

T1 - Oscillatory interlayer coupling with Cu and Zr underlayer thickness for Co/Cu multilayers

AU - Zhao, Tong Yun

AU - Shan, Zheng Sheng

AU - Shen, Bao Gen

AU - Zhao, Jian Gao

AU - Sellmyer, D. J.

PY - 1998/8/1

Y1 - 1998/8/1

N2 - Oscillatory behavior (with a period of about 9nm) of antiferromagnetic coupling with the thicknesses of Cu and Zr underlayers is reported for sputtered Co(1 nm)/Cu(2.3 nm) multilayers. The related oscillation of magnetoresistance is also observed. Based on the analysis of X-ray diffraction patterns, the variation of crystallographic orientation and modulation period is proved not responsible to the phenomenon. But the underlayer strongly affects the growth orientation of multilayer.

AB - Oscillatory behavior (with a period of about 9nm) of antiferromagnetic coupling with the thicknesses of Cu and Zr underlayers is reported for sputtered Co(1 nm)/Cu(2.3 nm) multilayers. The related oscillation of magnetoresistance is also observed. Based on the analysis of X-ray diffraction patterns, the variation of crystallographic orientation and modulation period is proved not responsible to the phenomenon. But the underlayer strongly affects the growth orientation of multilayer.

UR - http://www.scopus.com/inward/record.url?scp=0009914516&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0009914516&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0009914516

VL - 7

SP - 613

EP - 617

JO - Chinese Physics

JF - Chinese Physics

SN - 1009-1963

IS - 8

ER -