Oscillatory interlayer coupling with cu and zr underlayer thickness for Co/Cu multilayers

Tong Yun Zhao, Zheng Sheng Shan, Bao Gen Shen, Jian Gao Zhao, David J Sellmyer

Research output: Contribution to journalArticle

Abstract

Oscillatory behavior (with a period of about 9 nm) of antiferromagnetic coupling with the thicknesses of Cu and Zr underlayers is reported for sputtered Co(1 nm)/Cu(2.3 nm) multilayers. The related oscillation of magnetoresistance is also observed. Based on the analysis of X-ray diffraction patterns, the variation of crystallographic orientation and modulation period is proved not responsible to the phenomenon. But the underlayer strongly affects the growth orientation of multilayer.

Original languageEnglish (US)
Pages (from-to)613-617
Number of pages5
JournalActa Physica Sinica (overseas Edition)
Volume7
Issue number8
DOIs
StatePublished - Dec 1 1998

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interlayers
diffraction patterns
modulation
oscillations
x rays

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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Oscillatory interlayer coupling with cu and zr underlayer thickness for Co/Cu multilayers. / Zhao, Tong Yun; Shan, Zheng Sheng; Shen, Bao Gen; Zhao, Jian Gao; Sellmyer, David J.

In: Acta Physica Sinica (overseas Edition), Vol. 7, No. 8, 01.12.1998, p. 613-617.

Research output: Contribution to journalArticle

Zhao, Tong Yun ; Shan, Zheng Sheng ; Shen, Bao Gen ; Zhao, Jian Gao ; Sellmyer, David J. / Oscillatory interlayer coupling with cu and zr underlayer thickness for Co/Cu multilayers. In: Acta Physica Sinica (overseas Edition). 1998 ; Vol. 7, No. 8. pp. 613-617.
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