Optical properties of ZnSe and Zn0.87Mn0.13Se epilayers determined by spectroscopic ellipsometry

J. Kvietkova, B. Daniel, M. Hetterich, Mathias Schubert, D. Spemann

Research output: Contribution to journalConference article

19 Citations (Scopus)

Abstract

The semimagnetic ternary semiconductor material ZnMnSe is a suitable candidate for the use in optoelectronic devices either as a spin aligner or a waveguiding layer. In our work we are studying the optical properties of Zn 1-xMnxSe layers grown on GaAs (001) substrates by molecular beam epitaxy. We present the complex dielectric function obtained by variable-angle spectroscopic ellipsometry in the photon energy range from 0.75 to 4.5 eV. Between 0.75 and 3.3 eV the experimental data are fitted with a critical-point parametric model. The energies of E0, E 00, E1 and E 11 critical points are given for ZnSe and Zn0.87Mn0.13Se.

Original languageEnglish (US)
Pages (from-to)228-230
Number of pages3
JournalThin Solid Films
Volume455-456
DOIs
StatePublished - May 1 2004
EventThe 3rd International Conference on Spectroscopic Ellipsometry - Vienna, Austria
Duration: Jul 6 2003Jul 11 2003

Fingerprint

Spectroscopic ellipsometry
Epilayers
Molecular beam epitaxy
Optoelectronic devices
ellipsometry
critical point
Photons
Optical properties
Semiconductor materials
optical properties
Substrates
optoelectronic devices
molecular beam epitaxy
energy
photons
gallium arsenide

Keywords

  • Critical points
  • Dielectric properties
  • ZnMnSe
  • ZnSe

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

Optical properties of ZnSe and Zn0.87Mn0.13Se epilayers determined by spectroscopic ellipsometry. / Kvietkova, J.; Daniel, B.; Hetterich, M.; Schubert, Mathias; Spemann, D.

In: Thin Solid Films, Vol. 455-456, 01.05.2004, p. 228-230.

Research output: Contribution to journalConference article

Kvietkova, J. ; Daniel, B. ; Hetterich, M. ; Schubert, Mathias ; Spemann, D. / Optical properties of ZnSe and Zn0.87Mn0.13Se epilayers determined by spectroscopic ellipsometry. In: Thin Solid Films. 2004 ; Vol. 455-456. pp. 228-230.
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AU - Spemann, D.

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