Optical- and magneto-optical measurements using a variable angle of incidence spectroscopic ellipsometer: Application to DyCo multilayers

William A. McGahan, Z. S. Shan, Alan M. Massengale, Thomas E. Tiwald, John A. Woollam

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We have extended the technique of variable angle spectroscopic ellipsometry to measurement of the magneto-optical effects as a function of wavelength and angle of incidence and field strength. Results on DyCo multilayers are reported.

Original languageEnglish (US)
Pages (from-to)1271-1272
Number of pages2
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume7
Issue number3
DOIs
StatePublished - May 1989

Fingerprint

Magnetooptical effects
ellipsometers
Spectroscopic ellipsometry
optical measurement
Multilayers
incidence
Wavelength
ellipsometry
field strength
wavelengths

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this

Optical- and magneto-optical measurements using a variable angle of incidence spectroscopic ellipsometer : Application to DyCo multilayers. / McGahan, William A.; Shan, Z. S.; Massengale, Alan M.; Tiwald, Thomas E.; Woollam, John A.

In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 7, No. 3, 05.1989, p. 1271-1272.

Research output: Contribution to journalArticle

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