Optical and magneto-optical constants ofs

K. Wierman, J. Hilfiker, R. Sabiryanov, S. Jaswal, R. Kirby, J. Woollam

Research output: Contribution to journalArticle

27 Scopus citations

Abstract

Optically thick films of (Formula presented) were deposited on quartz using dc magnetron sputtering. The films were covered with an (Formula presented) protective overcoat and annealed in vacuum at 850 °C for 1 h to form the crystalline (Formula presented) ((Formula presented) Au) cubic structure. These films have a high degree of long-range order and are highly textured with the (111) axis along the film normal. Variable angle spectroscopic ellipsometry measurements were taken over the spectral range of 1.2-4.2 eV to determine the optical constants of both (Formula presented) and the (Formula presented) overcoat. Spectroscopic magneto-optic Kerr rotation and ellipticity measurements at near normal incidence over the spectral range of 1.4-3.6 eV were used to determine the off-diagonal dielectric tensor elements for (Formula presented) . First-principles electronic-structure calculations were carried out for the ordered (Formula presented) structure and from these the dielectric tensor elements of (Formula presented) were calculated. The experimental and theoretical values of the diagonal components of the dielectric tensor components are in good agreement. The agreement for the off-diagonal components of the dielectric tensor is only fair.

Original languageEnglish (US)
Pages (from-to)3093-3099
Number of pages7
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume55
Issue number5
DOIs
Publication statusPublished - Jan 1 1997

    Fingerprint

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this