On-line sensing and visual feedback for Atomic Force Microscopy (AFM) based nano-manipulations

Bo Song, Ning Xi, Ruiguo Yang, King Wai Chiu Lai, Chengeng Qu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

Atomic Force Microscopy (AFM) is a powerful and popular technique of single-molecule imaging both in air and liquid. Recent research and hardware development provide AFM with the function of manipulation nano-particle and modify sample surface in nano-scale. However, due to AFM usually takes several minutes to get an image and the surface change is hard to observe in real-time manipulation. In this paper, a novel approach for on-line sensing and display method is proposed and used for updating the surface change during the manipulation of cell. In this approach a cutting force detection model is used for cutting depth judgment. In addition, an adaptive local-scan strategy is involved here to get the topography of the local surface. Finally a display model is used to update the change of the surface during the manipulation. With this novel scheme the process of cell cutting become real-time visualized. So, AFM tip could work as an efficient nanolithography or cutting tool.

Original languageEnglish (US)
Title of host publication2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010
Pages71-74
Number of pages4
DOIs
Publication statusPublished - Dec 1 2010
Event2010 4th IEEE Nanotechnology Materials and Devices Conference, NMDC2010 - Monterey, CA, United States
Duration: Oct 12 2010Oct 15 2010

Publication series

Name2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010

Other

Other2010 4th IEEE Nanotechnology Materials and Devices Conference, NMDC2010
CountryUnited States
CityMonterey, CA
Period10/12/1010/15/10

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Materials Science (miscellaneous)

Cite this

Song, B., Xi, N., Yang, R., Lai, K. W. C., & Qu, C. (2010). On-line sensing and visual feedback for Atomic Force Microscopy (AFM) based nano-manipulations. In 2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010 (pp. 71-74). [5651906] (2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010). https://doi.org/10.1109/NMDC.2010.5651906