Noise measurement of YBa2Cu3O7-x and Ti2Ba2Ca2Cu3O10-x thin films

J. P. Zheng, Q. Y. Ying, S. Y. Dong, H. S. Kwok, Sy-Hwang Liou

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

The noise of YBa2Cu3O7-x and Tl 2Ba2Cr2Cu3O10-x thin films in the frequency range from 0.5 Hz to 100 kHz was studied. In the normal state, it was found that 1/f noise dominated, with a magnitude strongly dependent on temperature. In the superconducting state, the noise was only observable at frequencies below 5 Hz with our present setup. Equilibrium thermal fluctuation noise was not observed in these films.

Original languageEnglish (US)
Pages (from-to)553-555
Number of pages3
JournalJournal of Applied Physics
Volume69
Issue number1
DOIs
StatePublished - Dec 1 1991

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noise measurement
thin films
frequency ranges
temperature

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Noise measurement of YBa2Cu3O7-x and Ti2Ba2Ca2Cu3O10-x thin films. / Zheng, J. P.; Ying, Q. Y.; Dong, S. Y.; Kwok, H. S.; Liou, Sy-Hwang.

In: Journal of Applied Physics, Vol. 69, No. 1, 01.12.1991, p. 553-555.

Research output: Contribution to journalArticle

Zheng, J. P. ; Ying, Q. Y. ; Dong, S. Y. ; Kwok, H. S. ; Liou, Sy-Hwang. / Noise measurement of YBa2Cu3O7-x and Ti2Ba2Ca2Cu3O10-x thin films. In: Journal of Applied Physics. 1991 ; Vol. 69, No. 1. pp. 553-555.
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