Nanostructured FePt:B2O3 thin films with perpendicular magnetic anisotropy

C. P. Luo, Sy-Hwang Liou, L. Gao, Y. Liu, David J Sellmyer

Research output: Contribution to journalArticle

207 Citations (Scopus)

Abstract

FePt/B2O3 multilayers were deposited by magnetron sputtering onto 7059 glass substrates. By annealing the as-deposited films at 550°C, nanostructured FePt:B2O3 films consisting of FePt grains with L10 structure, embedded in a glassy B2O3 matrix, were obtained. The c axes of the FePt grains can be made to align with the film normal direction, which results in a perpendicular anisotropy constant of 3.5 × 107 erg/cc. The films remain layered structures after annealing when the B2O3 layer thickness exceeds 16 Å. The nanostructure of the films was investigated by transmission electron microscopy. The coercivities and the average grain sizes of the films are dependent on the B2O3 concentrations, with coercivities varying from 4 to 12 kOe, while average grain sizes vary from 4 to 17 nm. Strong perpendicular anisotropy, adjustable coercivity, and fine grain size suggest this nanocomposite system might have significant potential as recording media at extremely high areal density.

Original languageEnglish (US)
Pages (from-to)2225-2227
Number of pages3
JournalApplied Physics Letters
Volume77
Issue number14
DOIs
StatePublished - Oct 2 2000

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anisotropy
thin films
coercivity
grain size
annealing
magnetron sputtering
nanocomposites
recording
transmission electron microscopy
glass
matrices

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Nanostructured FePt:B2O3 thin films with perpendicular magnetic anisotropy. / Luo, C. P.; Liou, Sy-Hwang; Gao, L.; Liu, Y.; Sellmyer, David J.

In: Applied Physics Letters, Vol. 77, No. 14, 02.10.2000, p. 2225-2227.

Research output: Contribution to journalArticle

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