Nanostructure and magnetic properties of highly (001) oriented L1 0 (Fe 49Pt 51) 1-xCu x films

M. L. Yan, Y. F. Xu, David J Sellmyer

Research output: Contribution to journalArticle

46 Citations (Scopus)

Abstract

We report on nonepitaxially grown L 10 Cu-alloyed FePt thin films with strong (001) texture. The FePt films with different Cu contents were deposited directly on Si wafers with a Fe49 Pt51 Cu multilayer structure. The Cu content was varied from 0 to 13 at. %. All films were annealed at 600 °C for 5 min. X-ray-diffraction characterization showed that only one set of L 10 diffraction peaks appeared and no elemental Cu diffraction peaks were visible. This result, along with a varying ca lattice-parameter ratio, suggests that Cu substitutes Fe or Pt in the L 10 lattice and ternary FePtCu alloy films are formed. (001) texture was enhanced with the increase of Cu content. Transmission electron microscope images showed that the grain size of FePtCu was about 10 nm. For FePt film with 11 at. % Cu substitution, coercivity was about 5 kOe, which is suitable for writing in a practical perpendicular-recording film.

Original languageEnglish (US)
Article number08G903
JournalJournal of Applied Physics
Volume99
Issue number8
DOIs
StatePublished - May 25 2006

Fingerprint

magnetic properties
textures
diffraction
substitutes
ternary alloys
laminates
coercivity
lattice parameters
electron microscopes
grain size
recording
wafers
thin films
x rays

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

Cite this

Nanostructure and magnetic properties of highly (001) oriented L1 0 (Fe 49Pt 51) 1-xCu x films. / Yan, M. L.; Xu, Y. F.; Sellmyer, David J.

In: Journal of Applied Physics, Vol. 99, No. 8, 08G903, 25.05.2006.

Research output: Contribution to journalArticle

@article{51ffe33e5c524c878caf2bf80f0b3b63,
title = "Nanostructure and magnetic properties of highly (001) oriented L1 0 (Fe 49Pt 51) 1-xCu x films",
abstract = "We report on nonepitaxially grown L 10 Cu-alloyed FePt thin films with strong (001) texture. The FePt films with different Cu contents were deposited directly on Si wafers with a Fe49 Pt51 Cu multilayer structure. The Cu content was varied from 0 to 13 at. {\%}. All films were annealed at 600 °C for 5 min. X-ray-diffraction characterization showed that only one set of L 10 diffraction peaks appeared and no elemental Cu diffraction peaks were visible. This result, along with a varying ca lattice-parameter ratio, suggests that Cu substitutes Fe or Pt in the L 10 lattice and ternary FePtCu alloy films are formed. (001) texture was enhanced with the increase of Cu content. Transmission electron microscope images showed that the grain size of FePtCu was about 10 nm. For FePt film with 11 at. {\%} Cu substitution, coercivity was about 5 kOe, which is suitable for writing in a practical perpendicular-recording film.",
author = "Yan, {M. L.} and Xu, {Y. F.} and Sellmyer, {David J}",
year = "2006",
month = "5",
day = "25",
doi = "10.1063/1.2164428",
language = "English (US)",
volume = "99",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "8",

}

TY - JOUR

T1 - Nanostructure and magnetic properties of highly (001) oriented L1 0 (Fe 49Pt 51) 1-xCu x films

AU - Yan, M. L.

AU - Xu, Y. F.

AU - Sellmyer, David J

PY - 2006/5/25

Y1 - 2006/5/25

N2 - We report on nonepitaxially grown L 10 Cu-alloyed FePt thin films with strong (001) texture. The FePt films with different Cu contents were deposited directly on Si wafers with a Fe49 Pt51 Cu multilayer structure. The Cu content was varied from 0 to 13 at. %. All films were annealed at 600 °C for 5 min. X-ray-diffraction characterization showed that only one set of L 10 diffraction peaks appeared and no elemental Cu diffraction peaks were visible. This result, along with a varying ca lattice-parameter ratio, suggests that Cu substitutes Fe or Pt in the L 10 lattice and ternary FePtCu alloy films are formed. (001) texture was enhanced with the increase of Cu content. Transmission electron microscope images showed that the grain size of FePtCu was about 10 nm. For FePt film with 11 at. % Cu substitution, coercivity was about 5 kOe, which is suitable for writing in a practical perpendicular-recording film.

AB - We report on nonepitaxially grown L 10 Cu-alloyed FePt thin films with strong (001) texture. The FePt films with different Cu contents were deposited directly on Si wafers with a Fe49 Pt51 Cu multilayer structure. The Cu content was varied from 0 to 13 at. %. All films were annealed at 600 °C for 5 min. X-ray-diffraction characterization showed that only one set of L 10 diffraction peaks appeared and no elemental Cu diffraction peaks were visible. This result, along with a varying ca lattice-parameter ratio, suggests that Cu substitutes Fe or Pt in the L 10 lattice and ternary FePtCu alloy films are formed. (001) texture was enhanced with the increase of Cu content. Transmission electron microscope images showed that the grain size of FePtCu was about 10 nm. For FePt film with 11 at. % Cu substitution, coercivity was about 5 kOe, which is suitable for writing in a practical perpendicular-recording film.

UR - http://www.scopus.com/inward/record.url?scp=33646731954&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33646731954&partnerID=8YFLogxK

U2 - 10.1063/1.2164428

DO - 10.1063/1.2164428

M3 - Article

VL - 99

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 8

M1 - 08G903

ER -