Nanoscopic imaging of oxidized graphene monolayer using tip-enhanced Raman scattering

Joseph M. Smolsky, Alexey V Krasnoslobodtsev

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Tip-enhanced Raman scattering (TERS) can be used for the structural and chemical characterization of materials with a nanoscale resolution, and offers numerous advantages compared to other forms of imaging. We use TERS to track the local structural features of a CVD-grown graphene monolayer. Ag nanoparticles were added to AFM probes using ion-beam sputtering in order to make them TERS-active. Such modification provides probes with large factors of enhancement and good reproducibility. TERS measurements on graphene show an emergence of a defect-induced D-Raman band and a strain-induced shoulder of the graphene’s G-band. Comparison of TERS results with micro-Raman for oxidized graphene suggests that local oxidation occurs with the introduction of sp3 defects, under TERS conditions. [Figure not available: see fulltext.].

Original languageEnglish (US)
Pages (from-to)6346-6359
Number of pages14
JournalNano Research
Volume11
Issue number12
DOIs
StatePublished - Dec 1 2018

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Graphite
Graphene
Raman scattering
Monolayers
Imaging techniques
Defects
Ion beams
Sputtering
Chemical vapor deposition
Nanoparticles
Oxidation

Keywords

  • Raman spectroscopy
  • graphene
  • graphene oxidation
  • tip-enhanced Raman scattering

ASJC Scopus subject areas

  • Materials Science(all)
  • Electrical and Electronic Engineering

Cite this

Nanoscopic imaging of oxidized graphene monolayer using tip-enhanced Raman scattering. / Smolsky, Joseph M.; Krasnoslobodtsev, Alexey V.

In: Nano Research, Vol. 11, No. 12, 01.12.2018, p. 6346-6359.

Research output: Contribution to journalArticle

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