Multi-scale investigation of interface properties, stacking order and decoupling of few layer graphene on C-face 4H-SiC

C. Bouhafs, A. A. Zakharov, I. G. Ivanov, F. Giannazzo, J. Eriksson, V. Stanishev, P. Kühne, T. Iakimov, T. Hofmann, Mathias Schubert, F. Roccaforte, R. Yakimova, V. Darakchieva

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

In this work, we report a multi-scale investigation using several nano-, micro and macro-scale techniques of few layer graphene (FLG) sample consisting of large monolayer (ML) and bilayer (BL) areas grown on C-face 4H-SiC (000-1) by high-temperature sublimation. Single 1 × 1 diffraction patterns are observed by micro-low-energy electron diffraction for ML, BL and trilayer graphene with no indication of out-of-plane rotational disorder. A SiOx layer is identified between graphene and SiC by X-ray photoelectron emission spectroscopy and reflectance measurements. The chemical composition of the interface layer changes towards SiO2 and its thickness increases with aging in normal ambient conditions. The formation mechanism of the interface layer is discussed. It is shown by torsion resonance conductive atomic force microscopy that the interface layer causes the formation of non-ideal Schottky contact between ML graphene and SiC. This is attributed to the presence of a large density of interface states. Mid-infrared optical Hall effect measurements revealed Landau-level transitions in FLG that have a square-root dependence on magnetic field, which evidences a stack of decoupled graphene sheets. Contrary to previous works on decoupled C-face graphene, our BL and FLG are composed of ordered decoupled graphene layers without out-of-plane rotation.

Original languageEnglish (US)
Pages (from-to)722-732
Number of pages11
JournalCarbon
Volume116
DOIs
StatePublished - May 1 2017

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Graphite
Graphene
Monolayers
Low energy electron diffraction
Reflectometers
Interface states
Sublimation
Emission spectroscopy
Hall effect
Photoelectron spectroscopy
Torsional stress
Diffraction patterns
Macros
Atomic force microscopy
Aging of materials
Magnetic fields
Infrared radiation
X rays
Carbon

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)

Cite this

Bouhafs, C., Zakharov, A. A., Ivanov, I. G., Giannazzo, F., Eriksson, J., Stanishev, V., ... Darakchieva, V. (2017). Multi-scale investigation of interface properties, stacking order and decoupling of few layer graphene on C-face 4H-SiC. Carbon, 116, 722-732. https://doi.org/10.1016/j.carbon.2017.02.026

Multi-scale investigation of interface properties, stacking order and decoupling of few layer graphene on C-face 4H-SiC. / Bouhafs, C.; Zakharov, A. A.; Ivanov, I. G.; Giannazzo, F.; Eriksson, J.; Stanishev, V.; Kühne, P.; Iakimov, T.; Hofmann, T.; Schubert, Mathias; Roccaforte, F.; Yakimova, R.; Darakchieva, V.

In: Carbon, Vol. 116, 01.05.2017, p. 722-732.

Research output: Contribution to journalArticle

Bouhafs, C, Zakharov, AA, Ivanov, IG, Giannazzo, F, Eriksson, J, Stanishev, V, Kühne, P, Iakimov, T, Hofmann, T, Schubert, M, Roccaforte, F, Yakimova, R & Darakchieva, V 2017, 'Multi-scale investigation of interface properties, stacking order and decoupling of few layer graphene on C-face 4H-SiC', Carbon, vol. 116, pp. 722-732. https://doi.org/10.1016/j.carbon.2017.02.026
Bouhafs, C. ; Zakharov, A. A. ; Ivanov, I. G. ; Giannazzo, F. ; Eriksson, J. ; Stanishev, V. ; Kühne, P. ; Iakimov, T. ; Hofmann, T. ; Schubert, Mathias ; Roccaforte, F. ; Yakimova, R. ; Darakchieva, V. / Multi-scale investigation of interface properties, stacking order and decoupling of few layer graphene on C-face 4H-SiC. In: Carbon. 2017 ; Vol. 116. pp. 722-732.
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AU - Eriksson, J.

AU - Stanishev, V.

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