Model-based frequency response characterization of a digital-image analysis system for epifluorescence microscopy

Rajeeb Hazra, Charles L. Viles, Stephen K. Park, Stephen E. Reichenbach, Michael E. Sieracki

Research output: Contribution to journalArticle

3 Scopus citations


We describe a model-based method for estimating the spatial frequency response of a digital-imaging system (e.g., a CCD camera) that is modeled as a linear, shift-invariant image acquisition subsystem that is cascaded with a linear, shift-variant sampling subsystem. The method characterizes the twodimensional frequency response of the image acquisition subsystem to beyond the Nyquist frequency by accounting explicitly for insufficient sampling and the sample-scene phase. Results for simulated systems and a real CCD-based epifluorescence microscopy system are presented to demonstrate the accuracy of the method.

Original languageEnglish (US)
Pages (from-to)1083-1092
Number of pages10
JournalApplied optics
Issue number8
Publication statusPublished - Mar 1992


ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

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