Model-based frequency response characterization of a digital-image analysis system for epifluorescence microscopy

Rajeeb Hazra, Charles L. Viles, Stephen K. Park, Stephen E. Reichenbach, Michael E. Sieracki

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

We describe a model-based method for estimating the spatial frequency response of a digital-imaging system (e.g., a CCD camera) that is modeled as a linear, shift-invariant image acquisition subsystem that is cascaded with a linear, shift-variant sampling subsystem. The method characterizes the twodimensional frequency response of the image acquisition subsystem to beyond the Nyquist frequency by accounting explicitly for insufficient sampling and the sample-scene phase. Results for simulated systems and a real CCD-based epifluorescence microscopy system are presented to demonstrate the accuracy of the method.

Original languageEnglish (US)
Pages (from-to)1083-1092
Number of pages10
JournalApplied optics
Volume31
Issue number8
DOIs
StatePublished - Mar 1992

Fingerprint

Image acquisition
image analysis
Image analysis
frequency response
Frequency response
acquisition
Microscopic examination
sampling
Nyquist frequencies
Sampling
microscopy
shift
CCD cameras
Charge coupled devices
Imaging systems
charge coupled devices
estimating

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

Cite this

Model-based frequency response characterization of a digital-image analysis system for epifluorescence microscopy. / Hazra, Rajeeb; Viles, Charles L.; Park, Stephen K.; Reichenbach, Stephen E.; Sieracki, Michael E.

In: Applied optics, Vol. 31, No. 8, 03.1992, p. 1083-1092.

Research output: Contribution to journalArticle

Hazra, Rajeeb ; Viles, Charles L. ; Park, Stephen K. ; Reichenbach, Stephen E. ; Sieracki, Michael E. / Model-based frequency response characterization of a digital-image analysis system for epifluorescence microscopy. In: Applied optics. 1992 ; Vol. 31, No. 8. pp. 1083-1092.
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