Measuring ultralow emittance of laser-driven electron beams with spectroscopic imaging of inverse-Compton scattered x-rays

G. Golovin, S. Banerjee, C. Liu, S. Chen, J. Zhang, B. Zhao, P. Zhang, M. Veale, M. Wilson, P. Seller, D. Umstadter

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report the first measurement of laser-wakefield-accelerated electron beam transverse emittance, as well as its evolution, performed via a novel, non-destructive, and singleshot technique employing spectroscopic imaging of x-rays produced by inverse-Compton scattering.

Original languageEnglish (US)
Title of host publicationFrontiers in Optics, FiO 2016
PublisherOSA - The Optical Society
ISBN (Print)9781943580194
DOIs
Publication statusPublished - Jul 21 2014
EventFrontiers in Optics, FiO 2016 - Rochester, United States
Duration: Oct 17 2016Oct 21 2016

Publication series

NameOptics InfoBase Conference Papers

Other

OtherFrontiers in Optics, FiO 2016
CountryUnited States
CityRochester
Period10/17/1610/21/16

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

Cite this

Golovin, G., Banerjee, S., Liu, C., Chen, S., Zhang, J., Zhao, B., ... Umstadter, D. (2014). Measuring ultralow emittance of laser-driven electron beams with spectroscopic imaging of inverse-Compton scattered x-rays. In Frontiers in Optics, FiO 2016 (Optics InfoBase Conference Papers). OSA - The Optical Society. https://doi.org/10.1364/FIO.2016.FTu1C.3