Measurement of Poisson's ratio with contact-resonance atomic force microscopy

D. C. Hurley, J. A. Turner

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Abstract

We describe contact-resonance atomic force microscopy (AFM) methods to quantitatively measure Poisson's ratio or shear modulus G at the same time as Young's modulus E. In contact-resonance AFM, the frequencies of the cantilever's resonant vibrations are measured while the tip is in contact with the sample. Simultaneous measurement of flexural and torsional vibrational modes enables E and to be determined separately. Analysis methods are presented to relate the contact-resonance frequencies to the tip-sample contact stiffness, which in turn determines the sample's nanoscale elastic properties. Experimental results are presented for a glass specimen with fused silica used as a reference material. The agreement between our contact-resonance AFM measurements and values obtained from other means demonstrates the validity of the basic method.

Original languageEnglish (US)
Article number033509
JournalJournal of Applied Physics
Volume102
Issue number3
DOIs
Publication statusPublished - Aug 24 2007

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

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