Magnetic force microscopy observations of the magnetic behavior in Co-C nanodot arrays

L. Gao, S. H. Liou, M. Zheng, R. Skomski, M. L. Yan, D. J. Sellmyer, N. I. Polushkin

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Abstract

The nanomagnetic behavior of Co-C nanodot arrays was investigated by magnetic force microscopy (MFM) and an alternative gradient force magnetometer. The direction of the easy axis can be observed directly with MFM by comparing the saturated magnetization state and the remanent magnetization state. Interaction of the domain wall with local defects was observed by field dependent MFM measurements. Some types of defects that can pin domain wall movement were identified.

Original languageEnglish (US)
Pages (from-to)7311-7313
Number of pages3
JournalJournal of Applied Physics
Volume91
Issue number10 I
DOIs
StatePublished - May 15 2002

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

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