Low earth simulation and materials characterization

R. A. Synowki, Jeffrey S. Hale, John A. Woollam

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

Oxygen plasma ashers and an electron cyclotron resonance (ECR) sources are currently being used for low Earth orbit (LEO) simulation. The suitability of each of these simulation techniques is considered. Thin film coatings are characterized by optical techniques, including variable-angle spectroscopic ellipsometry, optical spectrophotometry, and laser light scatterometry. Atomic force microscopy (AFM) has been used to characterize the surface morphology of thin aluminum films as a function of substrate temperature during deposition. Results on diamondlike carbon (DLC) films show that DLC degrades with simulated atomic oxygen (AO) exposure at a rate comparable to Kapton polyimide. Since DLC is not as susceptible as Kapton to environmental factors such as moisture absorption, it could potentially provide more accurate measurements of AO fluence on short space flights.

Original languageEnglish (US)
Pages (from-to)116-119
Number of pages4
JournalJournal of Spacecraft and Rockets
Volume30
Issue number1
DOIs
StatePublished - Jan 1 1993

Fingerprint

Kapton (trademark)
Earth (planet)
oxygen
Oxygen
carbon
simulation
Carbon
Electron cyclotron resonance
atomic force microscopy
Spectroscopic ellipsometry
space flight
Carbon films
Spectrophotometry
oxygen plasma
low Earth orbits
spectrophotometry
Space flight
electron cyclotron resonance
polyimides
Polyimides

ASJC Scopus subject areas

  • Aerospace Engineering
  • Space and Planetary Science

Cite this

Low earth simulation and materials characterization. / Synowki, R. A.; Hale, Jeffrey S.; Woollam, John A.

In: Journal of Spacecraft and Rockets, Vol. 30, No. 1, 01.01.1993, p. 116-119.

Research output: Contribution to journalArticle

Synowki, R. A. ; Hale, Jeffrey S. ; Woollam, John A. / Low earth simulation and materials characterization. In: Journal of Spacecraft and Rockets. 1993 ; Vol. 30, No. 1. pp. 116-119.
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