Laser-driven electron beams with ultra-low emittance measured via inverse-compton-scattered X-rays

Grigory Golovin, Sudeep Banerjee, Cheng Liu, Shouyuan Chen, Jun Zhang, Baozhen Zhao, Ping Zhang, Matthew Veale, Matthew Wilson, Paul Seller, Donald Umstadter

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report results of a novel, non-destructive, and single-shot technique to measure the quality of laser-wakefield-accelerated electron beams. The technique is based on spectroscopic imaging of inverse-Compton-scattered x-rays. Record-low transverse electron-beam emittance was measured: 0.15(±0.06)p-mm-mrad.

Original languageEnglish (US)
Title of host publicationHigh Intensity Lasers and High Field Phenomena, HILAS 2016
PublisherOSA - The Optical Society
ISBN (Print)9781943580095
DOIs
StatePublished - Mar 14 2016
EventHigh Intensity Lasers and High Field Phenomena, HILAS 2016 - Long Beach, United States
Duration: Mar 20 2016Mar 22 2016

Publication series

NameOptics InfoBase Conference Papers

Other

OtherHigh Intensity Lasers and High Field Phenomena, HILAS 2016
CountryUnited States
CityLong Beach
Period3/20/163/22/16

Fingerprint

Electron beams
X rays
Lasers
Imaging techniques

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

Cite this

Golovin, G., Banerjee, S., Liu, C., Chen, S., Zhang, J., Zhao, B., ... Umstadter, D. (2016). Laser-driven electron beams with ultra-low emittance measured via inverse-compton-scattered X-rays. In High Intensity Lasers and High Field Phenomena, HILAS 2016 (Optics InfoBase Conference Papers). OSA - The Optical Society. https://doi.org/10.1364/HILAS.2016.HM3B.4.pdf

Laser-driven electron beams with ultra-low emittance measured via inverse-compton-scattered X-rays. / Golovin, Grigory; Banerjee, Sudeep; Liu, Cheng; Chen, Shouyuan; Zhang, Jun; Zhao, Baozhen; Zhang, Ping; Veale, Matthew; Wilson, Matthew; Seller, Paul; Umstadter, Donald.

High Intensity Lasers and High Field Phenomena, HILAS 2016. OSA - The Optical Society, 2016. (Optics InfoBase Conference Papers).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Golovin, G, Banerjee, S, Liu, C, Chen, S, Zhang, J, Zhao, B, Zhang, P, Veale, M, Wilson, M, Seller, P & Umstadter, D 2016, Laser-driven electron beams with ultra-low emittance measured via inverse-compton-scattered X-rays. in High Intensity Lasers and High Field Phenomena, HILAS 2016. Optics InfoBase Conference Papers, OSA - The Optical Society, High Intensity Lasers and High Field Phenomena, HILAS 2016, Long Beach, United States, 3/20/16. https://doi.org/10.1364/HILAS.2016.HM3B.4.pdf
Golovin G, Banerjee S, Liu C, Chen S, Zhang J, Zhao B et al. Laser-driven electron beams with ultra-low emittance measured via inverse-compton-scattered X-rays. In High Intensity Lasers and High Field Phenomena, HILAS 2016. OSA - The Optical Society. 2016. (Optics InfoBase Conference Papers). https://doi.org/10.1364/HILAS.2016.HM3B.4.pdf
Golovin, Grigory ; Banerjee, Sudeep ; Liu, Cheng ; Chen, Shouyuan ; Zhang, Jun ; Zhao, Baozhen ; Zhang, Ping ; Veale, Matthew ; Wilson, Matthew ; Seller, Paul ; Umstadter, Donald. / Laser-driven electron beams with ultra-low emittance measured via inverse-compton-scattered X-rays. High Intensity Lasers and High Field Phenomena, HILAS 2016. OSA - The Optical Society, 2016. (Optics InfoBase Conference Papers).
@inproceedings{c69be9d66bd64fd2bb04f297b2bf7fa0,
title = "Laser-driven electron beams with ultra-low emittance measured via inverse-compton-scattered X-rays",
abstract = "We report results of a novel, non-destructive, and single-shot technique to measure the quality of laser-wakefield-accelerated electron beams. The technique is based on spectroscopic imaging of inverse-Compton-scattered x-rays. Record-low transverse electron-beam emittance was measured: 0.15(±0.06)p-mm-mrad.",
author = "Grigory Golovin and Sudeep Banerjee and Cheng Liu and Shouyuan Chen and Jun Zhang and Baozhen Zhao and Ping Zhang and Matthew Veale and Matthew Wilson and Paul Seller and Donald Umstadter",
year = "2016",
month = "3",
day = "14",
doi = "10.1364/HILAS.2016.HM3B.4.pdf",
language = "English (US)",
isbn = "9781943580095",
series = "Optics InfoBase Conference Papers",
publisher = "OSA - The Optical Society",
booktitle = "High Intensity Lasers and High Field Phenomena, HILAS 2016",

}

TY - GEN

T1 - Laser-driven electron beams with ultra-low emittance measured via inverse-compton-scattered X-rays

AU - Golovin, Grigory

AU - Banerjee, Sudeep

AU - Liu, Cheng

AU - Chen, Shouyuan

AU - Zhang, Jun

AU - Zhao, Baozhen

AU - Zhang, Ping

AU - Veale, Matthew

AU - Wilson, Matthew

AU - Seller, Paul

AU - Umstadter, Donald

PY - 2016/3/14

Y1 - 2016/3/14

N2 - We report results of a novel, non-destructive, and single-shot technique to measure the quality of laser-wakefield-accelerated electron beams. The technique is based on spectroscopic imaging of inverse-Compton-scattered x-rays. Record-low transverse electron-beam emittance was measured: 0.15(±0.06)p-mm-mrad.

AB - We report results of a novel, non-destructive, and single-shot technique to measure the quality of laser-wakefield-accelerated electron beams. The technique is based on spectroscopic imaging of inverse-Compton-scattered x-rays. Record-low transverse electron-beam emittance was measured: 0.15(±0.06)p-mm-mrad.

UR - http://www.scopus.com/inward/record.url?scp=85019536795&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85019536795&partnerID=8YFLogxK

U2 - 10.1364/HILAS.2016.HM3B.4.pdf

DO - 10.1364/HILAS.2016.HM3B.4.pdf

M3 - Conference contribution

AN - SCOPUS:85019536795

SN - 9781943580095

T3 - Optics InfoBase Conference Papers

BT - High Intensity Lasers and High Field Phenomena, HILAS 2016

PB - OSA - The Optical Society

ER -