Irradiation induced effects at interfaces in a nanocrystalline ceria thin film on a Si substrate

Philip D. Edmondson, Neil P. Young, Chad M. Parish, Fereydoon Namavar, William J. Weber, Yanwen Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Thin films of nanocrystalline ceria on a Si substrate have been irradiated with 3 MeV Au+ ions to fluences of up to 1x1016 ions cm-2, at temperatures ranging between 160 to 400 K. During the irradiation, a band of contrast is observed to form at the thin film/substrate interface. Analysis by scanning transmission electron microscopy in conjunction with energy dispersive and electron energy loss spectroscopy techniques revealed that this band of contrast was a cerium silicate amorphous phase, with an approximate Ce:Si:O ratio of 1:1:3.

Original languageEnglish (US)
Title of host publicationAdvances in Materials for Nuclear Energy
Pages87-92
Number of pages6
DOIs
StatePublished - Nov 26 2013
Event2012 MRS Fall Meeting - Boston, MA, United States
Duration: Nov 25 2012Nov 30 2012

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1514
ISSN (Print)0272-9172

Conference

Conference2012 MRS Fall Meeting
CountryUnited States
CityBoston, MA
Period11/25/1211/30/12

Fingerprint

Cerium compounds
Irradiation
Ions
Cerium
Silicates
Thin films
irradiation
Electron energy loss spectroscopy
Substrates
thin films
cerium
silicates
fluence
ions
energy dissipation
electron energy
Transmission electron microscopy
transmission electron microscopy
Scanning electron microscopy
scanning electron microscopy

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Edmondson, P. D., Young, N. P., Parish, C. M., Namavar, F., Weber, W. J., & Zhang, Y. (2013). Irradiation induced effects at interfaces in a nanocrystalline ceria thin film on a Si substrate. In Advances in Materials for Nuclear Energy (pp. 87-92). (Materials Research Society Symposium Proceedings; Vol. 1514). https://doi.org/10.1557/opl.2013.387

Irradiation induced effects at interfaces in a nanocrystalline ceria thin film on a Si substrate. / Edmondson, Philip D.; Young, Neil P.; Parish, Chad M.; Namavar, Fereydoon; Weber, William J.; Zhang, Yanwen.

Advances in Materials for Nuclear Energy. 2013. p. 87-92 (Materials Research Society Symposium Proceedings; Vol. 1514).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Edmondson, PD, Young, NP, Parish, CM, Namavar, F, Weber, WJ & Zhang, Y 2013, Irradiation induced effects at interfaces in a nanocrystalline ceria thin film on a Si substrate. in Advances in Materials for Nuclear Energy. Materials Research Society Symposium Proceedings, vol. 1514, pp. 87-92, 2012 MRS Fall Meeting, Boston, MA, United States, 11/25/12. https://doi.org/10.1557/opl.2013.387
Edmondson PD, Young NP, Parish CM, Namavar F, Weber WJ, Zhang Y. Irradiation induced effects at interfaces in a nanocrystalline ceria thin film on a Si substrate. In Advances in Materials for Nuclear Energy. 2013. p. 87-92. (Materials Research Society Symposium Proceedings). https://doi.org/10.1557/opl.2013.387
Edmondson, Philip D. ; Young, Neil P. ; Parish, Chad M. ; Namavar, Fereydoon ; Weber, William J. ; Zhang, Yanwen. / Irradiation induced effects at interfaces in a nanocrystalline ceria thin film on a Si substrate. Advances in Materials for Nuclear Energy. 2013. pp. 87-92 (Materials Research Society Symposium Proceedings).
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